Quantifying Resistances across Nanoscale Low- and High-Angle Interspherulite Boundaries in Solution-Processed Organic Semiconductor Thin Films
Keyword(s):
2014 ◽
Vol 7
(7)
◽
pp. 2145-2159
◽
Keyword(s):
2018 ◽
Vol 30
(2)
◽
pp. 324-335
◽
2015 ◽
Vol 25
(35)
◽
pp. 5662-5668
◽
2017 ◽
Vol 27
(23)
◽
pp. 1701117
◽
Keyword(s):
Keyword(s):