scholarly journals High-resolution three-dimensional partially coherent diffraction imaging

2012 ◽  
Vol 3 (1) ◽  
Author(s):  
J.N. Clark ◽  
X. Huang ◽  
R. Harder ◽  
I.K. Robinson
2021 ◽  
Vol 140 ◽  
pp. 106530
Author(s):  
Yuanyuan Liu ◽  
Qingwen Liu ◽  
You Li ◽  
Junyong Zhang ◽  
Zuyuan He

2021 ◽  
Vol 7 (1) ◽  
Author(s):  
Bruce Lim ◽  
Ewen Bellec ◽  
Maxime Dupraz ◽  
Steven Leake ◽  
Andrea Resta ◽  
...  

AbstractCoherent diffraction imaging enables the imaging of individual defects, such as dislocations or stacking faults, in materials. These defects and their surrounding elastic strain fields have a critical influence on the macroscopic properties and functionality of materials. However, their identification in Bragg coherent diffraction imaging remains a challenge and requires significant data mining. The ability to identify defects from the diffraction pattern alone would be a significant advantage when targeting specific defect types and accelerates experiment design and execution. Here, we exploit a computational tool based on a three-dimensional (3D) parametric atomistic model and a convolutional neural network to predict dislocations in a crystal from its 3D coherent diffraction pattern. Simulated diffraction patterns from several thousands of relaxed atomistic configurations of nanocrystals are used to train the neural network and to predict the presence or absence of dislocations as well as their type (screw or edge). Our study paves the way for defect-recognition in 3D coherent diffraction patterns for material science.


2018 ◽  
Vol 74 (5) ◽  
pp. 512-517
Author(s):  
Miklós Tegze ◽  
Gábor Bortel

In coherent-diffraction-imaging experiments X-ray diffraction patterns of identical particles are recorded. The particles are injected into the X-ray free-electron laser (XFEL) beam in random orientations. If the particle has symmetry, finding the orientation of a pattern can be ambiguous. With some modifications, the correlation-maximization method can find the relative orientations of the diffraction patterns for the case of symmetric particles as well. After convergence, the correlation maps show the symmetry of the particle and can be used to determine the symmetry elements and their orientations. The C factor, slightly modified for the symmetric case, can indicate the consistency of the assembled three-dimensional intensity distribution.


2015 ◽  
Vol 23 (16) ◽  
pp. 20916 ◽  
Author(s):  
Zhilong Jiang ◽  
Suhas P. Veetil ◽  
Jun Cheng ◽  
Cheng Liu ◽  
Ling Wang ◽  
...  

2011 ◽  
Vol 36 (12) ◽  
pp. 2227 ◽  
Author(s):  
Stephan O. Hruszkewycz ◽  
Martin V. Holt ◽  
Ash Tripathi ◽  
Jörg Maser ◽  
Paul H. Fuoss

2012 ◽  
Vol 45 (4) ◽  
pp. 778-784 ◽  
Author(s):  
Xiaojing Huang ◽  
Ross Harder ◽  
Steven Leake ◽  
Jesse Clark ◽  
Ian Robinson

A complex three-dimensional quantitative image of an extended zinc oxide (ZnO) crystal has been obtained using Bragg coherent diffraction imaging integrated with ptychography. By scanning a 2.5 µm-long arm of a ZnO tetrapod across a 1.3 µm X-ray beam with fine step sizes while measuring a three-dimensional diffraction pattern at each scan spot, the three-dimensional electron density and projected displacement field of the entire crystal were recovered. The simultaneously reconstructed complex wavefront of the illumination combined with its coherence properties determined by a partial coherence analysis implemented in the reconstruction process provide a comprehensive characterization of the incident X-ray beam.


2016 ◽  
Vol 117 (22) ◽  
Author(s):  
W. Cha ◽  
A. Ulvestad ◽  
M. Allain ◽  
V. Chamard ◽  
R. Harder ◽  
...  

2019 ◽  
Vol 52 (3) ◽  
pp. 571-578 ◽  
Author(s):  
Y. Chushkin ◽  
F. Zontone ◽  
O. Cherkas ◽  
A. Gibaud

This article presents a combined approach where quantitative forward-scattering coherent diffraction imaging (CDI) is supported by crystal diffraction using 8.1 keV synchrotron X-ray radiation. The method allows the determination of the morphology, mass density and crystallinity of an isolated microscopic specimen. This approach is tested on three homogeneous samples made of different materials with different degrees of crystallinity. The mass density and morphology are revealed using three-dimensional coherent diffraction imaging with a resolution better than 36 nm. The crystallinity is extracted from the diffraction profiles measured simultaneously with coherent diffraction patterns. The presented approach extends CDI to structural characterization of samples when crystallinity aspects are of interest.


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