Edge dislocation slows down oxide ion diffusion in doped CeO2 by segregation of charged defects
2019 ◽
Vol 7
(23)
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pp. 13910-13916
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1999 ◽
Vol 46
(1)
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pp. 36-47
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2002 ◽
Vol 146
(1-2)
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pp. 185-193
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Keyword(s):
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2005 ◽
Vol 25
(13)
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pp. 3243-3248
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