scholarly journals Publisher Correction: Giant photothermal nonlinearity in a single silicon nanostructure

2020 ◽  
Vol 11 (1) ◽  
Author(s):  
Yi-Shiou Duh ◽  
Yusuke Nagasaki ◽  
Yu-Lung Tang ◽  
Pang-Han Wu ◽  
Hao-Yu Cheng ◽  
...  

An amendment to this paper has been published and can be accessed via a link at the top of the paper.

2016 ◽  
Author(s):  
Arijit Bera ◽  
Matthieu Roussey ◽  
Markku Kuittinen ◽  
Seppo Honkanen

2021 ◽  
Vol 155 (20) ◽  
pp. 204202
Author(s):  
Chien-Hsuan Li ◽  
Yu-Lung Tang ◽  
Junichi Takahara ◽  
Shi-Wei Chu

2019 ◽  
Vol 130 ◽  
pp. 217-221 ◽  
Author(s):  
Daohan Ge ◽  
Jianpei Shi ◽  
Jinxiu Wei ◽  
Liqiang Zhang ◽  
Zhen Zhang

2008 ◽  
Vol 41 (2) ◽  
pp. 024004 ◽  
Author(s):  
George Kokkoris ◽  
Angeliki Tserepi ◽  
Evangelos Gogolides

2006 ◽  
Vol 89 (18) ◽  
pp. 181909 ◽  
Author(s):  
Jee Soo Chang ◽  
Ji-Hong Jhe ◽  
Moon-Seung Yang ◽  
Jung H. Shin ◽  
Kyung Joong Kim ◽  
...  

ISRN Optics ◽  
2012 ◽  
Vol 2012 ◽  
pp. 1-6 ◽  
Author(s):  
Igor Iatsunskyi ◽  
Valentin Smyntyna ◽  
Nykolai Pavlenko ◽  
Olga Sviridova

Photoluminescent (PL) porous layers were formed on p-type silicon by a metal-assisted chemical etching method using H2O2 as an oxidizing agent. Silver particles were deposited on the (100) Si surface prior to immersion in a solution of HF and H2O2. The morphology of the porous silicon (PS) layer formed by this method was investigated by atomic force microscopy (AFM). Depending on the metal-assisted chemical etching conditions, the macro- or microporous structures could be formed. Luminescence from metal-assisted chemically etched layers was measured. It was found that the PL intensity increases with increasing etching time. This behaviour is attributed to increase of the density of the silicon nanostructure. It was found the shift of PL peak to a green region with increasing of deposition time can be attributed to the change in porous morphology. Finally, the PL spectra of samples formed by high concentrated solution of AgNO3 showed two narrow peaks of emission at 520 and 550 nm. These peaks can be attributed to formation of AgF and AgF2 on a silicon surface.


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