Development and application of a porous cage carrier method for detecting trace elements in soils by direct current glow discharge mass spectrometry

By using a porous cage carrier method, interferences were removed and the signal of Si was improved.

Comparison between the use of direct current glow discharge mass spectrometry and inductively coupled plasma quadrupole mass spectrometry for the analysis of trace elements in nuclear samples

Fresenius Journal of Analytical Chemistry ◽

10.1007/s002160000529 ◽

2000 ◽

Vol 368 (1) ◽

pp. 95-102 ◽

Cited By ~ 9

Author(s):

L. Aldave de las Heras ◽

F. Bocci ◽

M. Betti ◽

L. O. Actis-Dato

Keyword(s):

Mass Spectrometry ◽

Trace Elements ◽

Glow Discharge ◽

Direct Current ◽

Inductively Coupled Plasma ◽

Quadrupole Mass ◽

Quadrupole Mass Spectrometry ◽

Inductively Coupled

Determination of trace elements in high purity alumina powder by helium enhanced direct current glow discharge mass spectrometry

Spectrochimica Acta Part B Atomic Spectroscopy ◽

10.1016/j.sab.2016.05.003 ◽

2016 ◽

Vol 122 ◽

pp. 46-51 ◽

Cited By ~ 8

Author(s):

Sehoon Jung ◽

Sunhye Kim ◽

Joachim Hinrichs

Keyword(s):

Mass Spectrometry ◽

Trace Elements ◽

Glow Discharge ◽

Direct Current ◽

High Purity ◽

Alumina Powder

Glow discharge mass spectrometry study of the deposition of TiO2 thin films by direct current reactive magnetron sputtering of a Ti target

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.582059 ◽

1999 ◽

Vol 17 (6) ◽

pp. 3317-3321 ◽

Cited By ~ 36

Author(s):

V. Vancoppenolle ◽

P.-Y. Jouan ◽

M. Wautelet ◽

J.-P. Dauchot ◽

M. Hecq

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Glow Discharge ◽

Magnetron Sputtering ◽

Direct Current ◽

Reactive Magnetron Sputtering ◽

Reactive Magnetron ◽

Tio2 Thin Films ◽

Mass Spectrometry Study

Rare Earth Oxide Equilibria in Pulsed Direct Current Glow Discharge Mass Spectrometry

Analytical Chemistry ◽

10.1021/ac960019d ◽

1996 ◽

Vol 68 (13) ◽

pp. 2135-2140 ◽

Cited By ~ 4

Author(s):

Yuan Mei ◽

W. W. Harrison

Keyword(s):

Mass Spectrometry ◽

Rare Earth ◽

Glow Discharge ◽

Direct Current ◽

Rare Earth Oxide ◽

Pulsed Direct Current

Determination of trace elements in high purity molybdenum by glow discharge mass spectrometry.

BUNSEKI KAGAKU ◽

10.2116/bunsekikagaku.41.9_425 ◽

1992 ◽

Vol 41 (9) ◽

pp. 425-431 ◽

Cited By ~ 5

Author(s):

Takayuki MIZOTA ◽

Tetsuya NAKAMURA ◽

Kiyoshi IWASAKI

Keyword(s):

Mass Spectrometry ◽

Trace Elements ◽

Glow Discharge ◽

High Purity ◽

Quantitative Analysis of Zirconium Oxide by Direct Current Glow Discharge Mass Spectrometry Using a Secondary Cathode

Journal of Analytical Atomic Spectrometry ◽

10.1039/a605397a ◽

1997 ◽

Vol 12 (1) ◽

pp. 49-52 ◽

Cited By ~ 19

Author(s):

WIM SCHELLES ◽

REN� VAN GRIEKEN

Keyword(s):

Mass Spectrometry ◽

Quantitative Analysis ◽

Glow Discharge ◽

Direct Current ◽

Zirconium Oxide ◽

Influence of polycrystalline material on crater shape optimization and roughness using low-power/low-pressure direct-current glow discharge mass spectrometry

Journal of Analytical Atomic Spectrometry ◽

10.1039/d0ja00055h ◽

2020 ◽

Vol 35 (7) ◽

pp. 1450-1457

Author(s):

Gagan Paudel ◽

Sergey Khromov ◽

Martin Kasik ◽

Hans Jørgen Roven ◽

Marisa Di Sabatino

Keyword(s):

Mass Spectrometry ◽

Glow Discharge ◽

Low Power ◽

Shape Optimization ◽

Direct Current ◽

Polycrystalline Material ◽

Low Pressure ◽

Crater Bottom ◽

Crater Shape

It is likely that observation of roughness at crater bottom upon GDMS sputtering is due to differential sputtering of grains.

The use of a secondary cathode to analyse solid non-conducting samples with direct current glow discharge mass spectrometry: potential and restrictions

Fresenius Journal of Analytical Chemistry ◽

10.1007/s0021663550858 ◽

1996 ◽

Vol 355 (7-8) ◽

pp. 858-860 ◽

Cited By ~ 16

Author(s):

Wim Schelles ◽

Stefan De Gendt ◽

Kris Maes ◽

René Van Van Grieken

Keyword(s):

Mass Spectrometry ◽

Glow Discharge ◽

Direct Current ◽

Relative sensitivity factors in direct current glow discharge mass spectrometry using Kr and Xe gas ? Estimation of the role of Penning ionization

Fresenius Journal of Analytical Chemistry ◽

10.1007/bf00321629 ◽

1995 ◽

Vol 351 (2-3) ◽

pp. 148-153 ◽

Cited By ~ 8

Author(s):

Morimasa Saito

Keyword(s):

Mass Spectrometry ◽

Glow Discharge ◽

Direct Current ◽

Relative Sensitivity ◽

Penning Ionization ◽

Sensitivity Factors

Analysis of Stainless Steels by Direct Current Helium Glow Discharge Mass Spectrometry

Tetsu-to-Hagane ◽

10.2355/tetsutohagane1955.88.9_575 ◽

2002 ◽

Vol 88 (9) ◽

pp. 575-579 ◽

Cited By ~ 6

Author(s):

Shinji ITOH ◽

Hitoshi YAMAGUCHI ◽

Toshiyuki HOBO ◽

Takeshi KOBAYASHI

Keyword(s):

Mass Spectrometry ◽

Glow Discharge ◽

Direct Current ◽

Stainless Steels ◽