scholarly journals Revealing the elasticity of an individual aortic fiber during ageing at nanoscale by in situ atomic force microscopy

Nanoscale ◽  
2021 ◽  
Author(s):  
Alexandre Berquand ◽  
Amandine Wahart ◽  
Aubéri Henry ◽  
Laetitia Gorisse ◽  
Pascal Maurice ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Elastic Properties ◽  
Cross Sections ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Surrounding Matrix ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging

Atomic Force Microscopy imaging allows to correlate at high resolution local changes in the structure and the elastic properties of elastin fibers and of the surrounding matrix for mice aorta cross sections.

High resolution noncontact atomic force microscopy imaging with oxygen-terminated copper tips at 78 K

Nanoscale ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 2961-2965 ◽  
Author(s):  
Damla Yesilpinar ◽  
Bertram Schulze Lammers ◽  
Alexander Timmer ◽  
Saeed Amirjalayer ◽  
Harald Fuchs ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
High Precision ◽  
Organic Molecule ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Bond Lengths ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging

AFM experiments at 78 K with an atomically defined O-terminated Cu tip allow determining bond lengths of an organic molecule with high precision.

scholarly journals Development of an algorithm for tip-related artifacts identification in AFM biological film imaging

2005 ◽  
Vol 48 (4) ◽  
pp. 667-674 ◽  
Author(s):  
Rubens Bernardes-Filho ◽  
Odilio Benedito Garrido de Assis
Keyword(s):  
Atomic Force Microscopy ◽  
Simple Algorithm ◽  
Major Drawback ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Microscopy Images ◽  
Polysaccharide Film

One major drawback identified in atomic force microscopy imaging is the dependence of the image's precision on the shape of the probe tip. In this paper a simple algorithm is proposed to provide artifact identification signaling in-situ tip features in atomic force microscopy images. The base of the identifications lied when the angle formed between two scanned points was kept the same as the tip sweeps a certain length of the sample. The potential of the described method was illustrated on a chitosan polysaccharide film. The images produced were compared to evaluate tip-artifact regions. This algorithm showed promise as a tool in the measurement and characterization fields to separate true images from artificial images in probe microscopy.

In Situ Atomic Force Microscopy Imaging of Block Copolymer Micelles Adsorbed on a Solid Substrate

Langmuir ◽  
2003 ◽  
Vol 19 (24) ◽  
pp. 10449-10453 ◽  
Author(s):  
Simon D. Connell ◽  
Stephen Collins ◽  
Johan Fundin ◽  
Zhuo Yang ◽  
Ian W. Hamley
Keyword(s):  
Atomic Force Microscopy ◽  
Block Copolymer ◽  
Solid Substrate ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Block Copolymer Micelles ◽  
Copolymer Micelles

Real-Time In Situ Atomic Force Microscopy Imaging of Bismuth Crystal Growth

Langmuir ◽  
2009 ◽  
Vol 25 (19) ◽  
pp. 11228-11231 ◽  
Author(s):  
Sara E. C. Dale ◽  
Simon J. Bending ◽  
Laurence M. Peter
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Real Time ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Bismuth Crystal ◽  
Atomic Force Microscopy Imaging

In Situ Atomic Force Microscopy Imaging of Electrodeposition of Mixed Layers of Copper/Cuprous Oxide

1999 ◽  
Vol 146 (11) ◽  
pp. 4101-4104 ◽  
Author(s):  
A. Bonnefont ◽  
R. Kostecki ◽  
F. McLarnon ◽  
J. C. Arrayet ◽  
L. Servant ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Cuprous Oxide ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Mixed Layers

scholarly journals Probe Tips Functionalized with Colloidal Nanocrystal Tetrapods for High-Resolution Atomic Force Microscopy Imaging

Small ◽  
2008 ◽  
Vol 4 (12) ◽  
pp. 2123-2126 ◽  
Author(s):  
Concetta Nobile ◽  
Paul D. Ashby ◽  
P. James Schuck ◽  
Angela Fiore ◽  
Rosanna Mastria ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging
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