Energy Dependent XPS Measurements on Thin Films of a Poly(vinyl methyl ether)/Polystyrene Blend in Dependence on Film Thickness – Concentration Profile on a Nanometer Resolution to Understand the Behavior of Nanofilms
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The composition of the surface layer in dependence from the distance of the polymer/air interface in thin films with thicknesses below 100 nm of miscible polymer blends on a spatial...
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2017 ◽
Vol 146
(20)
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pp. 203321
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2020 ◽
Vol 71
(1)
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pp. 31-51
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2007 ◽
Vol 208
(19–20)
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pp. 2222-2228
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2009 ◽
Vol 131
(10)
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pp. 104907
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