Use of multiple emission lines and principal component regression for quantitative analysis in inductively coupled plasma atomic emission spectrometry with charge coupled device detection
1996 ◽
Vol 11
(11)
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pp. 1105
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2003 ◽
Vol 18
(3)
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pp. 274-281
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1998 ◽
Vol 13
(2)
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pp. 125-129
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1993 ◽
Vol 8
(6)
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pp. 795
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1988 ◽
Vol 206
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pp. 203-214
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2000 ◽
Vol 15
(8)
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pp. 979-982
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1995 ◽
Vol 311
(2)
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pp. 123-134
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2004 ◽
2015 ◽