Use of Normalized Relative Line Intensities for Qualitative and Semi-Quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part II: Applications to Qualitative Analysis with Line-Rich Matrices

In a previously published work, a procedure was described to conduct qualitative analysis in inductively coupled plasma atomic emission spectrometry, keeping in mind the possibility of spectral interferences. This procedure is based on the use of both line correlation and normalized relative line intensities of given elements. When spectral interferences due to a single or two major elements are observed for an analyte, use of multiple linear regression of the normalized relative line intensities of both the analyte and the major element provides information about the certainty of the presence of the analyte. This procedure has been used with an echelle grating-based dispersive system equipped with a custom segmented-array charge-coupled device detector and evaluated with the use of line-rich matrices such as Fe, Cr, and Ni. Satisfactory results were obtained even when several lines of the analyte suffered from interference. The only limitation was the number of available lines for a given analyte.