Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices
2010 ◽
Vol 4
(11)
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pp. 1773
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2004 ◽
Vol 109
(4)
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pp. 407
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1991 ◽
Vol 39
(8)
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pp. 1188-1192
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2010 ◽
Vol 58
(4)
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pp. 1038-1045
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2010 ◽
Vol 20
(3)
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pp. 306-312
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