Hybrid greedy pursuit algorithms for enhancing radar imaging quality




Author(s):  
Brennan Davis ◽  
Wilson Chi

Abstract The use of an antireflection coating for backside semiconductor failure analysis is discussed. The process of selecting an appropriate coating is described. Several known coatings are also described in regards to imaging quality, material properties, and the benefits to device analysis applications.



2011 ◽  
Vol 33 (3) ◽  
pp. 616-621
Author(s):  
Ling Wang ◽  
Shao-hua Wu


2000 ◽  
Author(s):  
Laura D. Vann ◽  
Kevin M. Cuomo ◽  
Jean E. Piou ◽  
Joseph T. Mayhan




Author(s):  
A. Demirkol ◽  
R.F. Cinar ◽  
Z. Demir






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