Simultaneous quantitative determination of strain and defect profiles within the active region along high-power diode laser bars by micro-photocurrent mapping

2004 ◽  
Vol 27 (1-3) ◽  
pp. 451-454 ◽  
Author(s):  
A. Gerhardt ◽  
J. W. Tomm ◽  
S. Schwirzke-Schaaf ◽  
J. Nagle ◽  
M. Oudart ◽  
...  
2012 ◽  
Vol 9 (7) ◽  
pp. 524-528 ◽  
Author(s):  
T Li ◽  
E J Hao ◽  
Z J Li ◽  
Y Wang ◽  
P Lu ◽  
...  

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