Simultaneous quantitative determination of strain and defect profiles within the active region along high-power diode laser bars by micro-photocurrent mapping
2004 ◽
Vol 27
(1-3)
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pp. 451-454
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2000 ◽
Vol 168
(1-4)
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pp. 71-74
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2000 ◽
Vol 33
(8)
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pp. 945-947
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2000 ◽
Vol 32
(1)
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pp. 11-14
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2015 ◽
Vol 16
(2)
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pp. 309-314
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2002 ◽
Vol 186
(1-4)
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pp. 162-165
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