scholarly journals The practical application of subwavelength focusing elements in the EHF imaging system

2019 ◽  
Vol 30 ◽  
pp. 12008
Author(s):  
Sergey Zhakupov ◽  
Alexander Badin ◽  
Alexander Berdyugin

This paper presents the results of modeling the processes of interaction of an electromagnetic wave of the EHF range with focusing elements made of materials with a refractive index n in the range from 1.2 to 2. Based on the obtained simulation results using additive technologies, an equilateral parallelepiped of acrylonitrile butadiene styrene with a refractive index was created n = 1.62. After which it was added to the EHF imaging system, and its focusing properties were analyzed. As a result of the experiments, pictures were obtained of the dependence of the intensity of electromagnetic radiation on the surface of test samples on the presence of a given focusing element in the system.

2019 ◽  
Vol 947 (5) ◽  
pp. 2-11
Author(s):  
D.V. Dementiev

In the instructions for modern geodetic instruments, it is recommended to introduce an amendment for the refraction, taking into account the “standard” refraction coefficient k = 0,13÷0,2. In fact, in the surface layer of the atmosphere, the refractive index can range from –6 to 6. Various classical methods of determining refraction are analyzed. Conclusions based on experimental work made by various researchers are presented. Using the results of numerous studies of various methods for determining vertical refraction, it can be concluded that all classical (static) methods do not provide a high degree of reliability to determine the refraction. An exception is the method of determining refraction at a neutral temperature stratification of the atmosphere, when the time interval is not very long. For this reason, their practical application is extremely limited. To improve the accuracy of determining refraction, it is necessary to take into account the turbulence of the atmosphere, that is, to use dynamic measurement methods that take the fluctuations of the electromagnetic wave passing through the path into account.


2021 ◽  
Vol 2140 (1) ◽  
pp. 012015
Author(s):  
A V Badin ◽  
A I Berdyugin ◽  
V D Moskalenko ◽  
K V Simonova ◽  
R P Gursky

Abstract This paper considers the development and application of a system of reflectometry for the analysis of the homogeneity of structures manufactured by additive technologies. A system of reflectometry based on a backward wave oscillator, a two-dimensional object positioning system and an optoacoustic detector (Goley cell) is described. The results of reflectometry of the hexagonal periodic structure of cells based on acrylonitrile butadiene styrene at a wavelength of 343 microns are presented.


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