ON THE APPROXIMATIVE SEMICLASSICAL FORMULA FOR THE ELECTRON-IMPACT WIDTH OF MULTIPLY IONIZED ATOM LINES IN PLASMAS

1979 ◽  
Vol 40 (C7) ◽  
pp. C7-815-C7-816
Author(s):  
M. Dimitrijevik ◽  
N. Konjevik
Keyword(s):  
Author(s):  
Raynald Gauvin ◽  
Gilles L'Espérance

Values of cross sections for ionization of inner-shell electrons by electron impact are required for electron probe microanalysis, Auger-electron spectroscopy and electron energy-loss spectroscopy. In this work, the results of the measurement of inner-shell ionization cross-sections by electron impact, Q, in a TEM are presented for the K shell.The measurement of QNi has been performed at 120 KeV in a TEM by measuring the net X-ray intensity of the Kα line of Ni, INi, which is related to QNi by the relation :(1)where i is the total electron dose, (Ω/4π)is the fractional solid angle, ω is the fluorescence yield, α is the relative intensity factor, ε is the Si (Li) detector efficiency, A is the atomic weight, ρ is the sample density, No is Avogadro's number, t' is the distance traveled by the electrons in the specimen which is equal to τ sec θ neglecting beam broadening where τ is the specimen thickness and θ is the angle between the electron beam and the normal of the thin foil and CNi is the weight fraction of Ni.


1980 ◽  
Vol 77 ◽  
pp. 773-777 ◽  
Author(s):  
F.J. de Heer ◽  
H.A. Van Sprang ◽  
G.R. Mohlmann

1993 ◽  
Vol 03 (C6) ◽  
pp. C6-117-C6-123 ◽  
Author(s):  
M. J. FORD ◽  
J. P. DOERING ◽  
J. W. COOPER ◽  
M. A. COPLAN ◽  
J. H. MOORE

2001 ◽  
Vol 11 (PR2) ◽  
pp. Pr2-309-Pr2-312
Author(s):  
K. M. Aggarwal ◽  
F. P. Keenan ◽  
S. J. Rose

1989 ◽  
Vol 50 (C1) ◽  
pp. C1-405-C1-409
Author(s):  
L. D. GARDNER ◽  
J. L. KOHL ◽  
D. W. SAVIN ◽  
A. R. YOUNG

Author(s):  
М. М. Ердевді ◽  
В. В. Звенигородський ◽  
П. П. Маркуш ◽  
О. Б. Шпеник

Author(s):  
О. Зацарінний ◽  
К. Бартшат ◽  
Л. Бандуріна ◽  
С. Гедеон ◽  
В. Лазур
Keyword(s):  

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