Electron-impact silane dissociation and deposition rate relationship in the PECVD of microcrystalline silicon thin films

2001 ◽  
Vol 11 (PR3) ◽  
pp. Pr3-715-Pr3-722 ◽  
Author(s):  
E. Amanatides ◽  
D. E. Rapakoulias ◽  
D. Mataras
2013 ◽  
Vol 178 (9) ◽  
pp. 691-694 ◽  
Author(s):  
S. Michard ◽  
M. Meier ◽  
B. Grootoonk ◽  
O. Astakhov ◽  
A. Gordijn ◽  
...  

Optik ◽  
2019 ◽  
Vol 180 ◽  
pp. 104-112 ◽  
Author(s):  
Xinli Li ◽  
Ruimin Jin ◽  
Lihua Li ◽  
Jingxiao Lu ◽  
Yongjun Gu ◽  
...  

2006 ◽  
Vol 511-512 ◽  
pp. 280-284 ◽  
Author(s):  
G. Ambrosone ◽  
U. Coscia ◽  
S. Lettieri ◽  
P. Maddalena ◽  
M. Ambrico ◽  
...  

2013 ◽  
Vol 652-654 ◽  
pp. 1739-1742
Author(s):  
Xia Wu ◽  
Long Gu ◽  
Ji Sen Zhang ◽  
Hui Dong Yang

Microcrystalline silicon thin films were deposited on glass substrates by VHF-PECVD varying the ratio of hydrogen dilution from 88% to 98%. The structural characteristics, deposition rate and photosensitivity of the films were investigated. With the improvement of the hydrogen dilution ratio, crystallization rate of the films had been improved which was much more stable than amorphous silicon that the films transmit from amorphous silicon to microcrystalline silicon. However the deposition rate had been reduced with the increase of the hydrogen dilution and the highest deposition rate was 0.43nm/s. The samples showed a downward trend of photosensitivity with optical and dark conductivity both decreasing first then increasing. Thus suitable hydrogen dilution ratio should be chosen according to the different needs in preparation of microcrystalline silicon film.


2013 ◽  
Vol 113 (20) ◽  
pp. 203505 ◽  
Author(s):  
Y. N. Guo ◽  
D. Y. Wei ◽  
S. Q. Xiao ◽  
S. Y. Huang ◽  
H. P. Zhou ◽  
...  

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