X‐ray reflectivity analysis of giant‐magnetoresistance spin‐valve layered structures

1992 ◽  
Vol 60 (13) ◽  
pp. 1573-1575 ◽  
Author(s):  
T. C. Huang ◽  
J.‐P. Nozieres ◽  
V. S. Speriosu ◽  
H. Lefakis ◽  
B. A. Gurney
Keyword(s):  
Giant Magnetoresistance ◽  
Spin Valve ◽  
Layered Structures ◽  
X Ray

Spin-Valve GMR Films Based on Antiferromagnetic NiMn

1999 ◽  
Vol 562 ◽  
Author(s):  
Geoff Anderson ◽  
Yiming Huai ◽  
Lena Miloslavsky
Keyword(s):  
Thermal Stability ◽  
Giant Magnetoresistance ◽  
Phonon Scattering ◽  
Spin Valve ◽  
Spin Valves ◽  
Blocking Temperature ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thermal Stability Of ◽  
Electron Phonon Scattering

ABSTRACTIn this work we have investigated the magnetic and structural properties of spin-valve films exchange biased by CoFe/NiMn compared to CoFe/lrMn spin valves. A spin-valve film of structure Ta/NiFe/CoFe/Cu/CoFe/NiMnITa showed a giant-magnetoresistance of 5.5% with a Hex∼850 Oe after annealing. Structural ordering of the NiMn in an fct phase after annealing has been observed using x-ray diffraction, with the data exhibiting pure fct(111) texture. The thermal stability of both the exchange pinning and magnetoresistance of NiMn spin-valves was evaluated. The blocking temperature (Tb) of this film is 400°C, compared to 225°C for IrMn based spin-valve films (IrMn thickness ∼50 Å). Blocking temperature distribution and remnant blocking temperature measurements also suggest that NiMn based spin-valves have far superior pinning stability with temperature than IrMn based spin-valves. Magnetoresistance measurements show a linear decrease with temperature due to electron-phonon scattering with the ∆R/R being reduced by 33% at 150°C (as compared to a 50% decrease for IrMn based spinvalves). Extended annealing at 150°C did not effect spin-valve performance, with ∆R/R and R being constant over 60 hours, suggesting that no appreciable interdiffusion is occurring.

Effect of high pressure-temperature on silicon layered structures as determined by X-ray diffraction and electron microscopy

2004 ◽  
Vol 27 (1-3) ◽  
pp. 415-418
Author(s):  
J. Bak-Misiuk ◽  
A. Misiuk ◽  
J. Ratajczak ◽  
A. Shalimov ◽  
I. Antonova ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Pressure ◽  
Layered Structures ◽  
X Ray Diffraction ◽  
X Ray

Giant Magnetoresistance Properties of Spin Valve Films in Current-perpendicular-to-plane Geometry.

2001 ◽  
Vol 25 (4−2) ◽  
pp. 807-810 ◽  
Author(s):  
K. Nagasaka ◽  
Y. Seyama ◽  
Y. Shimizu ◽  
A. Tanaka
Keyword(s):  
Giant Magnetoresistance ◽  
Spin Valve ◽  
Plane Geometry ◽  
Current Perpendicular To Plane

Which spin valve for next giant magnetoresistance head generation? (invited)

2000 ◽  
Vol 87 (9) ◽  
pp. 5377-5382 ◽  
Author(s):  
Satoru Araki ◽  
Masashi Sano ◽  
Shuxiang Li ◽  
Yoshihiro Tsuchiya ◽  
Olivier Redon ◽  
...  
Keyword(s):  
Giant Magnetoresistance ◽  
Spin Valve

Low resistance spin-valve-type current-perpendicular-to-plane giant magnetoresistance with Co75Fe25

2005 ◽  
Vol 97 (10) ◽  
pp. 10C507 ◽  
Author(s):  
Ken-ichi Aoshima ◽  
Nobuhiko Funabashi ◽  
Kenji Machida ◽  
Yasuyoshi Miyamoto ◽  
Kiyoshi Kuga
Keyword(s):  
Giant Magnetoresistance ◽  
Spin Valve ◽  
Low Resistance ◽  
Current Perpendicular To Plane
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