In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation
g={ϕ1Φϕ2} must be known in all points x={x1 x2 x3} of the material. This can be achieved by locationresolved
diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in
the orientation- as well as the location-coordinates can be achieved by three variants of a detector “sweeping”
technique in which an area detector is continuously moved during exposure. This technique results in
two-dimensionally continuous images which are sections and projections of the six-dimensional “orientation–
location” space. Further evaluation of these images depends on whether individual grains are resolved
in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this
technique is also, and particularly, suitable for the investigation of the interior of big samples.
High Resolution Imaging with a Moving Coded Aperture