scholarly journals High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method

2003 ◽  
Vol 35 (3-4) ◽  
pp. 253-271 ◽  
Author(s):  
H. J. Bunge ◽  
H. Klein ◽  
L. Wcislak ◽  
U. Garbe ◽  
W. Weiß ◽  
...  
Keyword(s):  
Polycrystalline Material ◽  
High Energy ◽  
Short Wave ◽  
High Resolution Imaging ◽  
X Rays ◽  
Area Detector ◽  
High Penetration ◽  
Detector Method ◽  
Resolution Imaging ◽  
Individual Grains

In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g={ϕ1Φϕ2} must be known in all points x={x1 x2 x3} of the material. This can be achieved by locationresolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation- as well as the location-coordinates can be achieved by three variants of a detector “sweeping” technique in which an area detector is continuously moved during exposure. This technique results in two-dimensionally continuous images which are sections and projections of the six-dimensional “orientation– location” space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples.

A ring coded‐aperture microscope for high‐resolution imaging of high‐energy x rays

1992 ◽  
Vol 63 (10) ◽  
pp. 5086-5088 ◽  
Author(s):  
D. Ress ◽  
D. R. Ciarlo ◽  
J. E. Stewart ◽  
P. M. Bell ◽  
D. R. Kania
Keyword(s):  
High Resolution ◽  
High Energy ◽  
Coded Aperture ◽  
High Resolution Imaging ◽  
X Rays ◽  
Resolution Imaging

Texture and microstructure analysis with high-energy synchrotron radiation

2004 ◽  
Vol 19 (1) ◽  
pp. 60-64 ◽  
Author(s):  
Hans J. Bunge
Keyword(s):  
Synchrotron Radiation ◽  
Orientation Distribution ◽  
High Energy ◽  
Polycrystalline Materials ◽  
Area Detector ◽  
High Penetration ◽  
High Lateral Resolution ◽  
Individual Grains ◽  
Relationship Of ◽  
Very High

Diffraction of high-energy synchrotron radiation with wavelengths in the range of 0.1 Å, provided by the beamline BW5 at HASYLAB in Hamburg, was used to measure textures (orientation distribution) and microstructures (spatial distribution) of the crystallites in various polycrystalline materials. In order to achieve extremely high angular-combined with very high lateral resolution a continuous sweeping technique with an area detector was employed. This technique “images” three different types of two-dimensional sections and projections of the six-dimensional orientation–location space onto the area detector. In many cases the orientations and locations of all individual grains of the sample can thus be seen simultaneously. The high penetration depth of this radiation in the range of several centimeters (comparable with that of neutrons) allows investigating big or capsulated samples. Examples are given of grain-resolved recrystallization textures, a soldering seam, a filled beverage can, and the orientation distribution of kamacite lamellae in an iron meteorite, elucidating the orientation relationship of the γ→α transformation in iron.

A high-energy triple-axis X-ray diffractometer for the study of the structure of bulk crystals

2004 ◽  
Vol 37 (6) ◽  
pp. 901-910 ◽  
Author(s):  
C. Seitz ◽  
M. Weisser ◽  
M. Gomm ◽  
R. Hock ◽  
A. Magerl
Keyword(s):  
High Energy ◽  
X Rays ◽  
Bulk Crystals ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Intensity ◽  
High Penetration ◽  
Massive Sample ◽  
Laue Geometry ◽  
The Ideal

A triple-axis diffractometer for high-energy X-ray diffraction is described. A 450 kV/4.5 kW stationary tungsten X-ray tube serves as the X-ray source. Normally, 220 reflections of thermally annealed Czochralski Si are employed for the monochromator and analyser. Their integrated reflectivity is about ten times higher than the ideal crystal value. With the same material as the sample, and working with the WKα line at 60 keV in symmetric Laue geometry for all axes, the full width at half-maximum (FWHM) values for the longitudinal and transversal resolution are 2.5 × 10−3and 1.1 × 10−4for ΔQ/Q, respectively, and the peak intensity for a non-dispersive setting is 3000 counts s−1. In particular, for a double-axis mode, an energy well above 100 keV from theBremsstrahlungspectrum can be used readily. High-energy X-rays are distinguished by a high penetration power and materials of several centimetre thickness can be analysed. The feasibility of performing experiments with massive sample environments is demonstrated.

High resolution imaging with high energy ion beams

1993 ◽  
Vol 77 (1-4) ◽  
pp. 153-168 ◽  
Author(s):  
G.J.F. Legge ◽  
J.S. Laird ◽  
L.M. Mason ◽  
A. Saint ◽  
M. Cholewa ◽  
...  
Keyword(s):  
High Resolution ◽  
High Energy ◽  
Ion Beams ◽  
High Resolution Imaging ◽  
Resolution Imaging

Observation and Analysis of Solar Flares that Cause Large-area Short-wave Communication Interruption

2021 ◽  
Author(s):  
Zhou Kangpo ◽  
Niu youtian ◽  
Liu weina ◽  
Wang zhaodi ◽  
Guo songhao ◽  
...  
Keyword(s):  
Solar Flares ◽  
Ionospheric Disturbance ◽  
Low Frequency ◽  
High Energy ◽  
Short Wave ◽  
Absorption Capacity ◽  
X Rays ◽  
Large Area ◽  
Radio Signals ◽  
Shortwave Communication

Abstract When a solar flare erupts, the sun emits a flood of X-rays and high-energy particles that reach Earth at the speed of light, causing a sudden ionospheric disturbance event (SID event). The D layer of the ionosphere absorbs high-frequency radio signals. With the increase of flare intensity, the D layer's absorption capacity becomes stronger, which leads to the decline of shortwave communication quality and even the interruption of shortwave communication. In this paper, solar flares, which caused large area short-wave communication interruption in recent years, are observed and analyzed by very low frequency (VLF) method, and the influence of solar flares on short-wave communication is summarized. Finally, several methods to deal with the short-wave communication interruption caused by solar flares are proposed.

Investigations of Buried Interfaces Using High Energy X-Ray Reflectivity

2001 ◽  
Vol 678 ◽  
Author(s):  
F. Rieutord ◽  
J. Eymery ◽  
O. Plantevin ◽  
B. Bataillou ◽  
D. Buttard ◽  
...  
Keyword(s):  
Grazing Angle ◽  
High Energy ◽  
Silicon On Insulator ◽  
Nanometer Scale ◽  
X Rays ◽  
X Ray ◽  
Buried Interfaces ◽  
High Penetration ◽  
Silicon Silicon ◽  
Insulator Substrate

AbstractX-ray reflectivity using high-energy X-rays allows one to characterize interfaces between thick materials at nanometer scale. The technique combines the high penetration of X-rays allowing the crossing of the radiation through large thicknesses of material with the interface sensitivity of grazing angle techniques. In the case of a buried interface between two thick materials, the beam enters the sample through the side of one material and contributions of external surfaces are suppressed. Then, the technique is sensitive to the interface structure only. Examples are given using wafer bonding interfaces, both in the hydrophilic case (as used e.g. in Silicon-On-Insulator substrate fabrication) and in the hydrophobic case (Silicon/Silicon bonding).

High resolution imaging and lithography with hard x rays using parabolic compound refractive lenses

2002 ◽  
Vol 73 (3) ◽  
pp. 1640-1642 ◽  
Author(s):  
C. G. Schroer ◽  
B. Benner ◽  
T. F. Günzler ◽  
M. Kuhlmann ◽  
C. Zimprich ◽  
...  
Keyword(s):  
High Resolution ◽  
High Resolution Imaging ◽  
X Rays ◽  
Resolution Imaging

scholarly journals Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials

2020 ◽  
Vol 4 (3) ◽  
pp. 25
Author(s):  
Kenji Suzuki ◽  
Ayumi Shiro ◽  
Hidenori Toyokawa ◽  
Choji Saji ◽  
Takahisa Shobu
Keyword(s):  
High Energy ◽  
Coarse Grained ◽  
X Rays ◽  
Pixel Detector ◽  
Bending Stress ◽  
Double Exposure ◽  
X Ray ◽  
Area Detector ◽  
Exposure Method ◽  
Coarse Grained Material

Stress measurements of coarse-grained material are difficult using synchrotron X-ray diffraction because the diffraction patterns of coarse-grained materials are spotty. In addition, the center of the diffraction pattern is unknown for the transmitted X-ray beam. Here, a double-exposure method is proposed as the countermeasure against this issue. In the experiment, we introduce a CdTe pixel detector. The detector is a newly developed area detector and can resolve high-energy X-rays. The strains of the coarse-grained material can be measured using a combination of the double-exposure method, white synchrotron X-ray, and the CdTe pixel detector. The bending stress in an austenitic stainless steel plate was measured using the proposed technique. As a result, the measured stress corresponded to the applied bending stress.

scholarly journals Texture Determination of Thin Cu-Wires by Synchrotron Radiation

2005 ◽  
Vol 495-497 ◽  
pp. 131-136 ◽  
Author(s):  
Heinz Günter Brokmeier ◽  
Brigitte Weiss ◽  
Sang Bong Yi ◽  
Wenhai Ye Yi ◽  
Klaus Dieter Liss ◽  
...  
Keyword(s):  
High Energy ◽  
Beam Line ◽  
X Rays ◽  
Sample Holder ◽  
Wire Length ◽  
Energy Beam ◽  
Thin Wires ◽  
Absorption Correction ◽  
High Penetration

A new method to investigate thin wires has been tested, which is based on a special sample holder and on a high energy X-rays. Due to the high penetration power of high energy Xrays quantitative texture data will be obtained without any additional corrections such as constant volume correction and absorption correction. The measurements have been carried out at the high energy beam line BW5 at HASYLAB – DESY (Hamburg). In order to overcome grain statistics problems on the investigated Cu-wire of 122µm thickness a special scanning routine together with the sample preparation allows to average over a wire length between 1mm and up to 240 mm.

High-resolution imaging with soft x-rays

Science ◽  
1982 ◽  
Vol 215 (4529) ◽  
pp. 150-152 ◽  
Author(s):  
A. Robinson
Keyword(s):  
High Resolution ◽  
High Resolution Imaging ◽  
X Rays ◽  
Resolution Imaging
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