The effect of dislocation contrast on x‐ray line broadening: A new approach to line profile analysis

1996 ◽  
Vol 69 (21) ◽  
pp. 3173-3175 ◽  
Author(s):  
T. Ungár ◽  
A. Borbély
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Line Broadening ◽  
New Approach ◽  
X Ray

scholarly journals Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

2007 ◽  
Vol 222 (11/2007) ◽  
Author(s):  
Jenõ Gubicza ◽  
Tamás Ungár
Keyword(s):  
Line Profile ◽  
Nanocrystalline Materials ◽  
Profile Analysis ◽  
Subgrain Size ◽  
Line Profile Analysis ◽  
Line Broadening ◽  
X Ray ◽  
Transmission Electron ◽  
Fitting Procedures ◽  
Dislocation Type

X-ray line profile analysis is a powerful alternative tool for determining dislocation densities, dislocation type, crystallite and subgrain size and size-distributions, and planar defects, especially the frequency of twin boundaries and stacking faults. The method is especially useful in the case of submicron grain size or nanocrystalline materials, where X-ray line broadening is a well pronounced effect, and the observation of defects with very large density is often not easy by transmission electron microscopy. The fundamentals of X-ray line broadening are summarized in terms of the different qualitative breadth methods, and the more sophisticated and more quantitative whole pattern fitting procedures. The efficiency and practical use of X-ray line profile analysis is shown by discussing its applications to metallic, ceramic, diamond-like and polymer nanomaterials.

Twinning, Dislocations and Grain Size in NanoSPD Materials Determined by X-Ray Diffraction

2008 ◽  
Vol 584-586 ◽  
pp. 571-578 ◽  
Author(s):  
Tamás Ungár ◽  
L. Balogh ◽  
Gábor Ribárik
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Systematic Analysis ◽  
Planar Defects ◽  
X Ray ◽  
Dislocation Densities ◽  
And Shifts

High resolution X-ray line profile analysis is sensitive to crystallite size, dislocation densities and character, and to planar defects, especially stacking faults or twinning. The different effects of microstructure features can be evaluated separately on the basis of the different corresponding profile functions and the different hkl dependences of line broadening. Profiles of faulted crystals consist of sub-profiles broadened and shifted according to different hkl conditions. The systematic analysis of the breadts and shifts of sub-profiles enables X-ray line profile analysis by using defect related profile functions corresponding to: (i) size, (ii) strain and (iii) planar faults, respectively. It is shown that twinning can either be enhanced or weakened by severe plastic deformation.

Microstructure of post-deformed ECAP-Ti investigated by Multiple X-Ray Line Profile Analysis

2006 ◽  
Vol 2006 (suppl_23_2006) ◽  
pp. 129-134 ◽  
Author(s):  
E. Schafler ◽  
K. Nyilas ◽  
S. Bernstorff ◽  
L. Zeipper ◽  
M. Zehetbauer ◽  
...  
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray

scholarly journals X-ray line profile analysis in alakali-treated ramie fiber

2003 ◽  
Vol 60 (6) ◽  
pp. 919-922 ◽  
Author(s):  
K. P. Sao ◽  
B. K. Samantaray ◽  
S. Bhattacherjee
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Ramie Fiber ◽  
Line Profile Analysis ◽  
X Ray

scholarly journals Investigations on Microstructural and Layer Disorder Parameters of Na-Montmorillonite-Glycine Intercalation Compounds

2012 ◽  
Vol 60 (1) ◽  
pp. 25-29 ◽  
Author(s):  
Adnan Hossain Khan ◽  
Parimal Bala ◽  
AFM Mustafizur Rahman ◽  
Mohammad Nurnabi
Keyword(s):  
Crystallite Size ◽  
Chain Length ◽  
Line Profile ◽  
Profile Analysis ◽  
Interlayer Spacing ◽  
Line Profile Analysis ◽  
X Ray ◽  
Microstructural Parameters ◽  
Silicate Layers ◽  
Layer Disorder

Glycine-Montmorillonite (Gly-MMT) composite has been synthesized through intercalation process using Na-Montmorillonite (Na- MMT) and glycine ethylester hydrochloride. Gly-MMT was employed for the synthesis of dipeptide (Gly-Gly-MMT). Microstructural parameters such as crystallite size, r.m.s. strain (<e2>1/2) and layer disorder parameters such as variation of interlayer spacing (g) and proportion of planes affected by such defects (?) of the samples have been calculated by X-ray line profile analysis. In comparison to Na-MMT the basal spacings (d001) of Gly-MMT and Gly-Gly-MMT were reduced by 2.4Å and 1.8Å respectively. The value of d001 of Gly-Gly-MMT (13.3 Å) suggests the monolayer orientation of dipeptide into interlayer spaces. It is also suggested that more homogeneity in the stacking of silicate layers is attained in Gly-Gly-MMT due to the increased chain length of the dipeptide and orientation in monolayer style.DOI: http://dx.doi.org/10.3329/dujs.v60i1.10331Dhaka Univ. J. Sci. 60(1): 25-29, 2012 (January)

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