Mean Stresses and Long-Range Internal Stresses in Cyclically Deformed Polycrystalline Copper Studied by High Resolution X-Ray Line Profile Analysis

1993 ◽  
Vol 35-36 ◽  
pp. 387-392
Author(s):  
Tamás Ungár ◽  
A. Borbély ◽  
Horst Biermann ◽  
G. Hoffmann ◽  
Haël Mughrabi
Keyword(s):  
High Resolution ◽  
Long Range ◽  
Line Profile ◽  
Profile Analysis ◽  
Internal Stresses ◽  
Line Profile Analysis ◽  
Polycrystalline Copper ◽  
X Ray ◽  
Mean Stresses

scholarly journals Dislocation density and Burgers vector population in fiber-textured Ni thin films determined by high-resolution X-ray line profile analysis

2012 ◽  
Vol 45 (1) ◽  
pp. 61-70 ◽  
Author(s):  
Gábor Csiszár ◽  
Karen Pantleon ◽  
Hossein Alimadadi ◽  
Gábor Ribárik ◽  
Tamás Ungár
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Dislocation Density ◽  
Line Profile ◽  
Profile Analysis ◽  
Domain Size ◽  
Line Profile Analysis ◽  
Burgers Vector ◽  
X Ray ◽  
Vector Population

Nanocrystalline Ni thin films have been produced by direct current electrodeposition with different additives and current density in order to obtain 〈100〉, 〈111〉 and 〈211〉 major fiber textures. The dislocation density, the Burgers vector population and the coherently scattering domain size distribution are determined by high-resolution X-ray diffraction line profile analysis. The substructure parameters are correlated with the strength of the films by using the combined Taylor and Hall–Petch relations. The convolutional multiple whole profile method is used to obtain the substructure parameters in the different coexisting texture components. A strong variation of the dislocation density is observed as a function of the deposition conditions.

Separation of Kα Doublet for Profile Analysis by Use of FFT

1992 ◽  
Vol 36 ◽  
pp. 623-629
Author(s):  
Yasuo Yoshioka ◽  
Shinichi Ohya
Keyword(s):  
High Resolution ◽  
Stress Analysis ◽  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Diffraction Profile ◽  
X Ray ◽  
Material Evaluation ◽  
Profile Parameter

Line-profile analysis is important for material evaluation as well as x-ray stress analysis. In the general case, the half-value breadth of the Kα doublet is used as the line-profile parameter, but it is preferable to use the half-value breadth of the Kα1 diffraction profile because of high resolution.

Microstructure of post-deformed ECAP-Ti investigated by Multiple X-Ray Line Profile Analysis

2006 ◽  
Vol 2006 (suppl_23_2006) ◽  
pp. 129-134 ◽  
Author(s):  
E. Schafler ◽  
K. Nyilas ◽  
S. Bernstorff ◽  
L. Zeipper ◽  
M. Zehetbauer ◽  
...  
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray

scholarly journals X-ray line profile analysis in alakali-treated ramie fiber

2003 ◽  
Vol 60 (6) ◽  
pp. 919-922 ◽  
Author(s):  
K. P. Sao ◽  
B. K. Samantaray ◽  
S. Bhattacherjee
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Ramie Fiber ◽  
Line Profile Analysis ◽  
X Ray

scholarly journals Investigations on Microstructural and Layer Disorder Parameters of Na-Montmorillonite-Glycine Intercalation Compounds

2012 ◽  
Vol 60 (1) ◽  
pp. 25-29 ◽  
Author(s):  
Adnan Hossain Khan ◽  
Parimal Bala ◽  
AFM Mustafizur Rahman ◽  
Mohammad Nurnabi
Keyword(s):  
Crystallite Size ◽  
Chain Length ◽  
Line Profile ◽  
Profile Analysis ◽  
Interlayer Spacing ◽  
Line Profile Analysis ◽  
X Ray ◽  
Microstructural Parameters ◽  
Silicate Layers ◽  
Layer Disorder

Glycine-Montmorillonite (Gly-MMT) composite has been synthesized through intercalation process using Na-Montmorillonite (Na- MMT) and glycine ethylester hydrochloride. Gly-MMT was employed for the synthesis of dipeptide (Gly-Gly-MMT). Microstructural parameters such as crystallite size, r.m.s. strain (<e2>1/2) and layer disorder parameters such as variation of interlayer spacing (g) and proportion of planes affected by such defects (?) of the samples have been calculated by X-ray line profile analysis. In comparison to Na-MMT the basal spacings (d001) of Gly-MMT and Gly-Gly-MMT were reduced by 2.4Å and 1.8Å respectively. The value of d001 of Gly-Gly-MMT (13.3 Å) suggests the monolayer orientation of dipeptide into interlayer spaces. It is also suggested that more homogeneity in the stacking of silicate layers is attained in Gly-Gly-MMT due to the increased chain length of the dipeptide and orientation in monolayer style.DOI: http://dx.doi.org/10.3329/dujs.v60i1.10331Dhaka Univ. J. Sci. 60(1): 25-29, 2012 (January)

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