Charge deep-level transient spectroscopy study of high-energy-electron-beam-irradiated hydrogenated amorphous silicon
2015 ◽
Vol 411
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pp. 119-124
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2015 ◽
Vol 66
(6)
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pp. 323-328
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2009 ◽
Vol 52
(8)
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pp. 2406-2411
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