Optical thickness measurement of very thin films with a Fabry‐Perot interferometer

1977 ◽  
Vol 48 (6) ◽  
pp. 2628-2629
Author(s):  
Wei‐tze Huang ◽  
R. N. Zitter
Keyword(s):  
Thin Films ◽  
Optical Thickness ◽  
Thickness Measurement ◽  
Fabry Perot

Microwave Fabry-Pérot Transmission through YBaCuO Superconducting Thin Films

1995 ◽  
Vol 75 (21) ◽  
pp. 3934-3937 ◽  
Author(s):  
H. E. Porţeanu ◽  
K. Karraï ◽  
R. Seifert ◽  
F. Koch ◽  
P. Berberich ◽  
...  
Keyword(s):  
Thin Films ◽  
Superconducting Thin Films ◽  
Fabry Perot

Nondestructive thickness measurement of thin films on microstructures

1968 ◽  
Vol 11 (11) ◽  
pp. 987-988 ◽  
Author(s):  
I. Fränz ◽  
W. Langheinrich
Keyword(s):  
Thin Films ◽  
Thickness Measurement

Effect of scattered light on the accuracy of thin clouds optical thickness measurement by a sun photometer

1994 ◽  
Author(s):  
Iosif L. Katsev ◽  
Eleonora P. Zege ◽  
Alexander S. Prikhach ◽  
Igor N. Polonsky
Keyword(s):  
Optical Thickness ◽  
Scattered Light ◽  
Thickness Measurement ◽  
Sun Photometer

The Thickness Measurement of Thin Films by Multiple Beam Interferometry

1950 ◽  
Vol 21 (9) ◽  
pp. 843-846 ◽  
Author(s):  
G. D. Scott ◽  
T. A. McLauchlan ◽  
R. S. Sennett
Keyword(s):  
Thin Films ◽  
Thickness Measurement ◽  
Multiple Beam ◽  
Multiple Beam Interferometry

scholarly journals Thickness measurement of thin films by x‐ray absorption

1991 ◽  
Vol 69 (1) ◽  
pp. 499-501 ◽  
Author(s):  
J. Chaudhuri ◽  
S. Shah
Keyword(s):  
Thin Films ◽  
Thickness Measurement ◽  
X Ray ◽  
X Ray Absorption

scholarly journals High-Resolution Optical Thickness Measurement Based on Electro-Optic Dual-Optical Frequency Comb Sources

2017 ◽  
Vol 23 (2) ◽  
pp. 140-146 ◽  
Author(s):  
Oscar E. Bonilla-Manrique ◽  
Pedro Martin-Mateos ◽  
Borja Jerez ◽  
Marta Ruiz-Llata ◽  
Pablo Acedo
Keyword(s):  
High Resolution ◽  
Optical Thickness ◽  
Frequency Comb ◽  
Thickness Measurement ◽  
Optical Frequency Comb ◽  
Optical Frequency ◽  
Electro Optic

Thickness Measurement of Thin Films Using an Improved Laser Probe

1987 ◽  
Author(s):  
K.H. Yang ◽  
S.Y. Zhang ◽  
Z.N. Lu ◽  
L. Chen
Keyword(s):  
Thin Films ◽  
Thickness Measurement ◽  
Laser Probe
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