Robust atomic resolution imaging of light elements using scanning transmission electron microscopy

Atomic Resolution ◽

Light Elements ◽

Transmission Electron ◽

Scanning Transmission ◽

Robust Atomic-Resolution Imaging of Lithium in Battery Materials by Center-of-Mass Scanning Transmission Electron Microscopy

ACS Nano ◽

10.1021/acsnano.1c09374 ◽

2022 ◽

Author(s):

Michael J. Zachman ◽

Zhenzhong Yang ◽

Yingge Du ◽

Miaofang Chi

Keyword(s):

Electron Microscopy ◽

Center Of Mass ◽

Atomic Resolution ◽

Battery Materials ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Bright Field Scanning Transmission Electron Microscopy - Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials

Microscopy and Microanalysis ◽

10.1017/s1431927615010478 ◽

2015 ◽

Vol 21 (S3) ◽

pp. 1939-1940

Author(s):

Scott D. Findlay

Keyword(s):

Electron Microscopy ◽

Atomic Resolution ◽

Light Elements ◽

Bright Field ◽

Crystalline Materials ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials

Microscopy Today ◽

10.1017/s1551929517001006 ◽

2017 ◽

Vol 25 (6) ◽

pp. 36-41

Author(s):

Scott D. Findlay ◽

Naoya Shibata ◽

Yuichi Ikuhara ◽

Rong Huang ◽

Eiji Okunishi ◽

...

Keyword(s):

Electron Microscopy ◽

Atomic Resolution ◽

Light Elements ◽

Bright Field ◽

Crystalline Materials ◽

Transmission Electron ◽

Scanning Transmission ◽

Atomic-Resolution Cryogenic Scanning Transmission Electron Microscopy for Quantum Materials

Accounts of Chemical Research ◽

10.1021/acs.accounts.1c00303 ◽

2021 ◽

Author(s):

Elisabeth Bianco ◽

Lena F. Kourkoutis

Keyword(s):

Electron Microscopy ◽

Atomic Resolution ◽

Transmission Electron ◽

Scanning Transmission ◽

Quantum Materials

Atomic-resolution Studies of Ca3Co4O9 using in-situ Scanning Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927608083499 ◽

2008 ◽

Vol 14 (S2) ◽

pp. 436-437 ◽

Cited By ~ 1

Author(s):

G Yang ◽

Y Zhao ◽

K Sader ◽

A Bleloch ◽

RF Klie

Keyword(s):

Electron Microscopy ◽

New Mexico ◽

Atomic Resolution ◽

Transmission Electron ◽

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Absolute-Scale Comparison with Simulation for Quantitative Energy-Dispersive X-Ray Spectroscopy in Atomic-Resolution Scanning Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927617002628 ◽

2017 ◽

Vol 23 (S1) ◽

pp. 388-389 ◽

Cited By ~ 1

Author(s):

S.D. Findlay ◽

Z. Chen ◽

M. Weyland ◽

X. Sang ◽

W. Xu ◽

...

Keyword(s):

Electron Microscopy ◽

Energy Dispersive ◽

Atomic Resolution ◽

X Ray ◽

Absolute Scale ◽

Transmission Electron ◽

Tracking oxidation of individual iron nanoparticles with atomic resolution using aberration-corrected environmental in situ scanning transmission electron microscopy

10.22443/rms.emc2020.1388 ◽

2021 ◽

Author(s):

Roland Kröger ◽

Keyword(s):

Electron Microscopy ◽

Iron Nanoparticles ◽

Atomic Resolution ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution

Ultramicroscopy ◽

10.1016/j.ultramic.2021.113425 ◽

2021 ◽

pp. 113425

Author(s):

H.L. Robert ◽

I. Lobato ◽

F.J. Lyu ◽

Q. Chen ◽

S. Van Aert ◽

...

Keyword(s):

Electron Microscopy ◽

High Energy ◽

Atomic Resolution ◽

Dynamical Diffraction ◽

Transmission Electron ◽

High Energy Electrons ◽

Joint non-rigid image registration and reconstruction for quantitative atomic resolution scanning transmission electron microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2018.12.016 ◽

2019 ◽

Vol 198 ◽

pp. 49-57 ◽

Cited By ~ 4

Author(s):

Benjamin Berkels ◽

Christian H. Liebscher

Keyword(s):

Electron Microscopy ◽

Image Registration ◽

Atomic Resolution ◽

Transmission Electron ◽

Insights into radiation damage from atomic resolution scanning transmission electron microscopy imaging of mono-layer CuPcCl16 films on graphene

Scientific Reports ◽

10.1038/s41598-018-23077-z ◽

2018 ◽

Vol 8 (1) ◽

Cited By ~ 8

Author(s):

Andreas Mittelberger ◽

Christian Kramberger ◽

Jannik C. Meyer

Keyword(s):

Electron Microscopy ◽

Radiation Damage ◽

Atomic Resolution ◽

Microscopy Imaging ◽

Mono Layer ◽

Transmission Electron ◽