Scanning electron microscopy study of seeded recrystallization of silicon‐on‐insulator layers with either polycrystalline or epitaxially deposited silicon in the seed windows
2014 ◽
Vol 48
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pp. 57-65
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2020 ◽
Vol 12
(03)
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2017 ◽
Vol 174
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pp. 10-16
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1988 ◽
Vol 3
(2)
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pp. 251-255
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1982 ◽
Vol 128
(5)
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pp. 1060-1063
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