A measurement of a minority‐carrier lifetime in ap‐type silicon wafer by a two‐mercury probe method

1989 ◽  
Vol 66 (11) ◽  
pp. 5398-5403 ◽  
Author(s):  
Eiichi Suzuki ◽  
Yutaka Hayashi
Keyword(s):  
Silicon Wafer ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Probe Method ◽  
Type Silicon

The effect of oxide precipitates on minority carrier lifetime in p-type silicon

2011 ◽  
Vol 110 (5) ◽  
pp. 053713 ◽  
Author(s):  
J. D. Murphy ◽  
K. Bothe ◽  
M. Olmo ◽  
V. V. Voronkov ◽  
R. J. Falster
Keyword(s):  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Type Silicon ◽  
P Type

On the Measurement of Minority Carrier Lifetime in n-Type Silicon

1955 ◽  
Vol 68 (3) ◽  
pp. 121-129 ◽  
Author(s):  
J B Arthur ◽  
W Bardsley ◽  
A F Gibson ◽  
C A Hogarth
Keyword(s):  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Type Silicon

scholarly journals Minority-carrier lifetime and defect content of n-type silicon grown by the noncontact crucible method

2014 ◽  
Vol 407 ◽  
pp. 31-36 ◽  
Author(s):  
Maulid Kivambe ◽  
Douglas M. Powell ◽  
Sergio Castellanos ◽  
Mallory Ann Jensen ◽  
Ashley E. Morishige ◽  
...  
Keyword(s):  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Type Silicon ◽  
Defect Content
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