The effects of device geometry on the negative bias temperature instability of Hf-In-Zn-O thin film transistors under light illumination
2010 ◽
Vol 157
(2)
◽
pp. J29
◽
2011 ◽
Vol 26
(10)
◽
pp. 105007
◽
2009 ◽
Vol 12
(6)
◽
pp. H229
◽
2006 ◽
Vol 27
(11)
◽
pp. 893-895
◽
2009 ◽
Vol 56
(4)
◽
pp. 587-594
◽
2008 ◽
Vol 29
(5)
◽
pp. 477-479
◽
2008 ◽
Vol 29
(2)
◽
pp. 165-167
◽