Direct observation of N-(group V) bonding defects in dilute nitride semiconductors using hard x-ray photoelectron spectroscopy

2011 ◽  
Vol 98 (12) ◽  
pp. 121915 ◽  
Author(s):  
F. Ishikawa ◽  
S. Fuyuno ◽  
K. Higashi ◽  
M. Kondow ◽  
M. Machida ◽  
...  
2007 ◽  
Author(s):  
M. Felici ◽  
A. Polimeni ◽  
F. Masia ◽  
R. Trotta ◽  
G. Pettinari ◽  
...  

2018 ◽  
Vol 33 (5) ◽  
pp. 053001 ◽  
Author(s):  
Marco Felici ◽  
Giorgio Pettinari ◽  
Francesco Biccari ◽  
Mario Capizzi ◽  
Antonio Polimeni

2004 ◽  
Vol 16 (31) ◽  
pp. S3161-S3170 ◽  
Author(s):  
P R Chalker ◽  
T J Bullough ◽  
M Gass ◽  
S Thomas ◽  
T B Joyce

2018 ◽  
Vol 133 (3) ◽  
Author(s):  
J. C. Sandoval-Santana ◽  
V. G. Ibarra-Sierra ◽  
S. Azaizia ◽  
H. Carrère ◽  
L. A. Bakaleinikov ◽  
...  

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