Direct observation of N-(group V) bonding defects in dilute nitride semiconductors using hard x-ray photoelectron spectroscopy
2009 ◽
Vol 130
(11)
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pp. 114706
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2018 ◽
Vol 33
(5)
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pp. 053001
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2004 ◽
Vol 16
(31)
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pp. S3161-S3170
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2007 ◽
Vol 45
(2)
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pp. 295-299
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Keyword(s):
1982 ◽
Vol 21
(Part 1, No. 6)
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pp. 822-824
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