The origin of defects in SiO2thermally grown on Czochralski silicon substrates
1994 ◽
Vol 141
(12)
◽
pp. 3453-3456
◽
1994 ◽
Vol 141
(9)
◽
pp. 2460-2464
◽
2012 ◽
Vol 51
(10S)
◽
pp. 10NA08
◽
2011 ◽
Vol 26
(7)
◽
pp. 072001
◽
Keyword(s):
2000 ◽
Vol 147
(2)
◽
pp. 756
◽
2012 ◽
Vol 51
◽
pp. 10NA08
◽