Characterization and Elimination of Defects in Oxide Layers Grown on Czochralski Silicon Substrates

1994 ◽  
Vol 141 (9) ◽  
pp. 2460-2464 ◽  
Author(s):  
Manabu Itsumi

1995 ◽  
Vol 78 (3) ◽  
pp. 1940-1943 ◽  
Author(s):  
Manabu Itsumi ◽  
Masato Tomita ◽  
Masataka Yamawaki


1994 ◽  
Vol 141 (12) ◽  
pp. 3453-3456 ◽  
Author(s):  
Paul K. Chu ◽  
Roger J. Bleiler ◽  
Jenny M. Metz


2012 ◽  
Vol 51 (10S) ◽  
pp. 10NA08 ◽  
Author(s):  
Brett Hallam ◽  
Stuart Wenham ◽  
Haeseok Lee ◽  
Eunjoo Lee ◽  
Hyunwoo Lee ◽  
...  


2010 ◽  
Vol 8 (3) ◽  
pp. 674-677 ◽  
Author(s):  
Jiahe Chen ◽  
Jan Vanhellemont ◽  
Eddy Simoen ◽  
Johan Lauwaert ◽  
Henk Vrielinck ◽  
...  


2010 ◽  
Vol 96 (3) ◽  
pp. 032105 ◽  
Author(s):  
Yevgeniya Larionova ◽  
Verena Mertens ◽  
Nils-Peter Harder ◽  
Rolf Brendel


2011 ◽  
Vol 26 (7) ◽  
pp. 072001 ◽  
Author(s):  
A Abuelgasim ◽  
K Mallik ◽  
P Ashburn ◽  
D M Jordan ◽  
P R Wilshaw ◽  
...  


2000 ◽  
Vol 147 (2) ◽  
pp. 756 ◽  
Author(s):  
Koji Sueoka ◽  
Masanori Akatsuka ◽  
Mitsuharu Yonemura ◽  
Toshiaki Ono ◽  
Eiichi Asayama ◽  
...  


2013 ◽  
Vol 114 (11) ◽  
pp. 114104 ◽  
Author(s):  
Y. Enta ◽  
T. Nagai ◽  
T. Yoshida ◽  
N. Ujiie ◽  
H. Nakazawa


1992 ◽  
Vol 72 (6) ◽  
pp. 2185-2191 ◽  
Author(s):  
Manabu Itsumi ◽  
Osaake Nakajima ◽  
Noboru Shiono


2017 ◽  
Vol 656 ◽  
pp. 96-100 ◽  
Author(s):  
Yoshiharu Enta ◽  
Shodai Osanai ◽  
Takahito Ogasawara


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