Transmission electron microscopy study of stacking faults and the associated partial dislocations in pseudomorphic epilayers of ZnSe/GaAs(001)

1996 ◽  
Vol 80 (9) ◽  
pp. 5506-5508 ◽  
Author(s):  
N. Wang ◽  
I. K. Sou ◽  
K. K. Fung
1994 ◽  
Vol 70 (5) ◽  
pp. 1077-1094 ◽  
Author(s):  
J. J. Couderc ◽  
S. Fritsch ◽  
M. Brieu ◽  
G. Vanderschaeve ◽  
M. Fagot ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document