Structural characterization of zinc sulphide thin films by radial distribution function analysis using x - ray scattering

Author(s):  
Maria Stefan ◽  
Emil Indrea ◽  
Elisabeth-Jeanne Popovici ◽  
Maria Loredana Soran ◽  
Ovidiu Pana ◽  
...  
2012 ◽  
Vol 544 ◽  
pp. 34-38 ◽  
Author(s):  
T. Hosokai ◽  
A. Hinderhofer ◽  
A. Vorobiev ◽  
C. Lorch ◽  
T. Watanabe ◽  
...  

2008 ◽  
Vol 14 (S2) ◽  
pp. 406-407
Author(s):  
DB Saint John ◽  
NJ Podraza ◽  
BD Gauntt ◽  
J Li ◽  
EC Dickey

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008


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