Long-term stability of a quasiperiodic Ta/Al multilayer: Disintegration at room temperature analyzed by grazing angle x-ray scattering and photoelectron spectroscopy

In order to set up a successful mammography screening program in the Republic of Srpska, a Siemens Mammomat 1000 X-ray machine was selected for analysis as the said mammography system is widely used in clinical practice. The variations in tube parameters (specific air kerma, high-voltage accuracy and reproducibility, linearity between exposure and dose exposure time) were monitored over a five-year period, from 2008 to 2012. In addition, due to observed daily fluctuations for chosen parameters, a series of measurements were performed three times a day within a single-month period (mainly October 2012). The goal of such an experimental set up is to assess short-term and long-term stability of tube parameters in the given mammography unit and to make a comparison between them. The present paper shows how an early detection of significant parameter fluctuations can help eliminate irregularities and optimize the performance of mammography systems.

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Long‐term stability of invisible X‐ray fluorescence identification tags

X-Ray Spectrometry ◽

10.1002/xrs.3119 ◽

2019 ◽

Vol 49 (2) ◽

pp. 302-307 ◽

Cited By ~ 1

Author(s):

Barbora Benetková ◽

Jan Krejčí ◽

Klára Drábková ◽

Michal Ďurovič ◽

Michal Veselý ◽

...

Keyword(s):

X Ray ◽

Term Stability ◽

Long Term Stability ◽

Identification Tags

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Determination of Strain Distributions in Aluminum Thin Films as a Function of Temperature by the use of Synchrotron Grazing Incidence X-Ray Scattering

MRS Proceedings ◽

10.1557/proc-239-227 ◽

1991 ◽

Vol 239 ◽

Cited By ~ 8

Author(s):

Ramnath Venkatraman ◽

Paul R. Besser ◽

Sean Brennan ◽

John C. Bravman

Keyword(s):

Thin Films ◽

Room Temperature ◽

Grazing Incidence ◽

Surface Relaxation ◽

Line Broadening ◽

X Ray ◽

Relaxation Effects ◽

X Ray Scattering ◽

Ray Scattering

ABSTRACTWe have measured elastic strain distributions with depth as a function of temperature in Al thin films of various thicknesses on oxidized silicon using synchrotron grazing incidence X-ray scattering (GIXS). Disregarding minor surface relaxation effects that depend on the film thickness, it is shown that there are no gross strain gradients in these films in the range of temperatures (between room temperature and 400°C) considered. We also observe X-ray line broadening effects, suggesting an accumulation of dislocations on cooling the films, and their annealing out as the films are reheated.

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Using room temperature ionic liquid to fabricate PEDOT/TiO2 nanocomposite electrode-based electrochromic devices with enhanced long-term stability

Solar Energy Materials and Solar Cells ◽

10.1016/j.solmat.2008.04.021 ◽

2008 ◽

Vol 92 (10) ◽

pp. 1253-1259 ◽

Cited By ~ 61

Author(s):

LongJian Ma ◽

YongXiang Li ◽

XiaoFeng Yu ◽

QunBao Yang ◽

Chang-Ho Noh

Keyword(s):

Ionic Liquid ◽

Room Temperature ◽

Room Temperature Ionic Liquid ◽

Electrochromic Devices ◽

Term Stability ◽

Long Term Stability

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Material Aspects of A-Sin:H Based 2D Direct X-Ray Sensor Array

MRS Proceedings ◽

10.1557/proc-507-231 ◽

1998 ◽

Vol 507 ◽

Cited By ~ 1

Author(s):

I. Popov ◽

G. Van Doorselaer ◽

A. Van Calster ◽

H. De Smet ◽

E. Boesman ◽

...

Keyword(s):

Thin Film ◽

Thin Films ◽

Sensor Array ◽

X Ray ◽

Term Stability ◽

Long Term Stability

ABSTRACTThe possibility of creating an 2D X-ray sensor array on the base of a-SiN:H thin films without switching elements and an X-ray conversion layer is presented in this report. The behavior of a-SiN:H Thin-Film Diode under X-ray irradiation, its limitations, and ways of increasing long-term stability and sensitivity of the sensor are discussed.

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Lanthanide Refractory Semiconductors Based on the Th3P4 Structure

MRS Proceedings ◽

10.1557/proc-97-359 ◽

1987 ◽

Vol 97 ◽

Cited By ~ 12

Author(s):

K. A. Gschneidner ◽

J. F. Nakahara ◽

B. J. Beaudry ◽

T. Takeshita ◽

Ames Laboratory

Keyword(s):

Electrical Resistivity ◽

Thermal Properties ◽

Seebeck Coefficient ◽

Thermoelectric Properties ◽

Room Temperature ◽

Type Structure ◽

Term Stability ◽

Long Term Stability ◽

Phase Relationships

ABSTRACTThe phase relationships and the important structural, electrical and thermal properties of the R3X4-R2X3 (where R = lanthanides and X = S, Se and Te) phases having the Th3P4 -type structure are reviewed. The room temperature electrical resistivity and Seebeck coefficient of these materials are independent of R and only slightly dependent on X, but critically dependent on the X:R ratio. The long term stability of these phases is also reviewed. Although these materials have good thermoelectric properties there are some problems which need to be solved before these phases can be utilized in thermoelectric devices. These problems include long term stability, higher than desirable thermal conductivities, and low electron mobilities.

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