The long-term stability of an X-ray fluorescence method of analysing thin films of indium antimonide

1980 ◽  
Vol 66 (3) ◽  
pp. L59-L61
Author(s):  
R.H. Hartley
1998 ◽  
Vol 507 ◽  
Author(s):  
I. Popov ◽  
G. Van Doorselaer ◽  
A. Van Calster ◽  
H. De Smet ◽  
E. Boesman ◽  
...  

ABSTRACTThe possibility of creating an 2D X-ray sensor array on the base of a-SiN:H thin films without switching elements and an X-ray conversion layer is presented in this report. The behavior of a-SiN:H Thin-Film Diode under X-ray irradiation, its limitations, and ways of increasing long-term stability and sensitivity of the sensor are discussed.


RSC Advances ◽  
2018 ◽  
Vol 8 (37) ◽  
pp. 20990-20995 ◽  
Author(s):  
Xiang Yang ◽  
Shu Jiang ◽  
Jun Li ◽  
Jian-Hua Zhang ◽  
Xi-Feng Li

In this paper, W-doped ZnSnO (WZTO) thin films and TFT devices are successfully fabricated by a wet-solution technique.


2014 ◽  
Vol 29 (4) ◽  
pp. 321-325
Author(s):  
Jovica Praskalo ◽  
Jasna Davidovic ◽  
Biljana Kocic ◽  
Monika Zivkovic ◽  
Svetlana Pejovic

In order to set up a successful mammography screening program in the Republic of Srpska, a Siemens Mammomat 1000 X-ray machine was selected for analysis as the said mammography system is widely used in clinical practice. The variations in tube parameters (specific air kerma, high-voltage accuracy and reproducibility, linearity between exposure and dose exposure time) were monitored over a five-year period, from 2008 to 2012. In addition, due to observed daily fluctuations for chosen parameters, a series of measurements were performed three times a day within a single-month period (mainly October 2012). The goal of such an experimental set up is to assess short-term and long-term stability of tube parameters in the given mammography unit and to make a comparison between them. The present paper shows how an early detection of significant parameter fluctuations can help eliminate irregularities and optimize the performance of mammography systems.


1980 ◽  
Vol 7 (1-3) ◽  
pp. 171-179
Author(s):  
J. Griessing

There is a striking dependence of the evaporation deposition geometry (i.e. angular distribution of the incident vapor beam) on the properties of deposited conductive films. This paper discusses solderability, adhesion and long-term stability of adhesion of Ti-Pd-Au, Ti-Au and Ti-Cu films. In all cases the above properties were improved by an evaporation deposition geometry with steep angles of the incident vapor beam.


2019 ◽  
Vol 49 (2) ◽  
pp. 302-307 ◽  
Author(s):  
Barbora Benetková ◽  
Jan Krejčí ◽  
Klára Drábková ◽  
Michal Ďurovič ◽  
Michal Veselý ◽  
...  

2011 ◽  
Vol 18 (7-8) ◽  
pp. 879-884 ◽  
Author(s):  
A. Bittner ◽  
N. Pagel ◽  
H. Seidel ◽  
U. Schmid

2009 ◽  
Vol 697 (1) ◽  
pp. L1-L5 ◽  
Author(s):  
Tetsuichi Kishishita ◽  
Takaaki Tanaka ◽  
Yasunobu Uchiyama ◽  
Tadayuki Takahashi

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