Accumulation capacitance frequency dispersion of III-V metal-insulator-semiconductor devices due to disorder induced gap states

2014 ◽  
Vol 116 (1) ◽  
pp. 014504 ◽  
Author(s):  
R. V. Galatage ◽  
D. M. Zhernokletov ◽  
H. Dong ◽  
B. Brennan ◽  
C. L. Hinkle ◽  
...  
Keyword(s):  
Semiconductor Devices ◽  
Frequency Dispersion ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor ◽  
Gap States

Correct extraction of frequency dispersion in accumulation capacitance in InGaAs metal-insulator-semiconductor devices

2016 ◽  
Vol 12 (6) ◽  
pp. 768-772 ◽  
Author(s):  
Woo Chul Lee ◽  
Cheol Jin Cho ◽  
Jung-Hae Choi ◽  
Jin Dong Song ◽  
Cheol Seong Hwang ◽  
...  
Keyword(s):  
Semiconductor Devices ◽  
Frequency Dispersion ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor

Interface charge engineering in AlTiO/AlGaN/GaN metal–insulator–semiconductor devices

2020 ◽  
Vol 127 (9) ◽  
pp. 094501
Author(s):  
Duong Dai Nguyen ◽  
Toshi-kazu Suzuki
Keyword(s):  
Semiconductor Devices ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor ◽  
Interface Charge

Correlation between fixed charge and capacitance peaks in silicon nanocrystal metal–insulator–semiconductor devices

2010 ◽  
Vol 25 (4) ◽  
pp. 045011 ◽  
Author(s):  
C Flynn ◽  
D König ◽  
I Perez-Wurfl ◽  
M A Green ◽  
G Conibeer
Keyword(s):  
Semiconductor Devices ◽  
Fixed Charge ◽  
Silicon Nanocrystal ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor

Interface states in polymer metal-insulator-semiconductor devices

2005 ◽  
Vol 98 (7) ◽  
pp. 073710 ◽  
Author(s):  
I. Torres ◽  
D. M. Taylor
Keyword(s):  
Semiconductor Devices ◽  
Interface States ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor ◽  
Polymer Metal

scholarly journals DYNAMIC STORAGE TIME MEASUREMENTS OF N-TYPE Hg1-xCdxTe METAL-INSULATOR-SEMICONDUCTOR DEVICES

1994 ◽  
Vol 43 (11) ◽  
pp. 1883
Author(s):  
HUANG HE ◽  
TANG DING-YUAN ◽  
TONG FEI-MING ◽  
ZHENG GUO-ZHEN
Keyword(s):  
Storage Time ◽  
Semiconductor Devices ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor ◽  
Dynamic Storage

Analysis of thin CdS layers on InP for improved metal–insulator–semiconductor devices

1996 ◽  
Vol 80 (5) ◽  
pp. 2873-2882 ◽  
Author(s):  
Helen M. Dauplaise ◽  
Kenneth Vaccaro ◽  
Andrew Davis ◽  
George O. Ramseyer ◽  
Joseph P. Lorenzo
Keyword(s):  
Semiconductor Devices ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor

Admittance of metal–insulator–semiconductor devices based on HgCdTe nBn structures

2020 ◽  
Vol 35 (5) ◽  
pp. 055026 ◽  
Author(s):  
A V Voitsekhovskii ◽  
S N Nesmelov ◽  
S M Dzyadukh ◽  
S A Dvoretsky ◽  
N N Mikhailov ◽  
...  
Keyword(s):  
Semiconductor Devices ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor
Sign in / Sign up

Export Citation Format

Share Document