Characterization of electrically-active defects in ultraviolet light-emitting diodes with laser-based failure analysis techniques
2016 ◽
Vol 119
(2)
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pp. 024505
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Mary A. Miller
◽
Paiboon Tangyunyong
◽
Edward I. Cole
2019 ◽
Vol 507
◽
pp. 65-69
◽
Yuanpeng Wu
◽
Yongjie Wang
◽
Kai Sun
◽
Zetian Mi
2016 ◽
Vol 49
(36)
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pp. 364006
◽
Z Mi
◽
S Zhao
◽
S Y Woo
◽
M Bugnet
◽
M Djavid
◽
...
2008 ◽
Vol 30
(5)
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pp. 800-805
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A. Žukauskas
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P. Vitta
◽
N. Kurilčik
◽
S. Juršėnas
◽
E. Bakienė
Yen-Kuang Kuo
◽
Jih-Yuan Chang
2015 ◽
Vol 11
(4)
◽
pp. 664-669
◽
Haoning Wang
◽
Hao Long
◽
Zhao Chen
◽
Xiaoming Mo
◽
Songzhan Li
◽
...
X. A. Cao
◽
Stephen F. LeBoeuf
◽
Stephen D. Arthur
◽
Danielle W. Merfeld
◽
Mark P. D'Evelyn
2013 ◽
Vol 63
(11)
◽
pp. 2204-2208
◽
Seong-Ran Jeon
◽
Sung-Jin Son
◽
Si-Hyun Park
2019 ◽
Vol 11
(5)
◽
pp. 157-164
Anand V. Sampath
◽
Meredith Reed
◽
Christoper Chua
◽
Gregory Garrett
◽
Eric D. Readinger
◽
...