scholarly journals Characterization of electrically-active defects in ultraviolet light-emitting diodes with laser-based failure analysis techniques

2016 ◽  
Vol 119 (2) ◽  
pp. 024505 ◽  
Author(s):  
Mary A. Miller ◽  
Paiboon Tangyunyong ◽  
Edward I. Cole
2004 ◽  
Author(s):  
X. A. Cao ◽  
Stephen F. LeBoeuf ◽  
Stephen D. Arthur ◽  
Danielle W. Merfeld ◽  
Mark P. D'Evelyn

2019 ◽  
Vol 11 (5) ◽  
pp. 157-164
Author(s):  
Anand V. Sampath ◽  
Meredith Reed ◽  
Christoper Chua ◽  
Gregory Garrett ◽  
Eric D. Readinger ◽  
...  

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