scholarly journals Theory of intraband plasmons in doped carbon nanotubes: Rolled surface-plasmons of graphene

2016 ◽  
Vol 108 (16) ◽  
pp. 163109 ◽  
Author(s):  
Ken-ichi Sasaki ◽  
Shuichi Murakami ◽  
Hideki Yamamoto
2011 ◽  
Vol 111 (5) ◽  
pp. 733-742 ◽  
Author(s):  
I. V. Bondarev ◽  
L. M. Woods ◽  
A. Popescu

Nanoscale ◽  
2021 ◽  
Author(s):  
Xiaoling Tian ◽  
Runlun Chen ◽  
Jianing Chen

We experimentally and theoretically investigated the propagation and subwavelength coupling of surface plasmons in duo carbon nanotubes (DCNTs). We found two plasmon modes in the Fourier transformed near-field images of...


2017 ◽  
Vol 9 (1) ◽  
pp. 01017-1-01017-4
Author(s):  
A. V. Korotun ◽  
◽  
І. М. Titov ◽  
A. O. Koval’ ◽  
◽  
...  

2018 ◽  
Vol 48 (9) ◽  
pp. 849-853
Author(s):  
S A Afanas'ev ◽  
I O Zolotovskii ◽  
A S Kadochkin ◽  
S G Moiseev ◽  
V V Svetukhin ◽  
...  

Carbon ◽  
2020 ◽  
Vol 167 ◽  
pp. 455-474 ◽  
Author(s):  
M. Shoufie Ukhtary ◽  
Riichiro Saito

Author(s):  
Jun Jiao

HREM studies of the carbonaceous material deposited on the cathode of a Huffman-Krätschmer arc reactor have shown a rich variety of multiple-walled nano-clusters of different shapes and forms. The preparation of the samples, as well as the variety of cluster shapes, including triangular, rhombohedral and pentagonal projections, are described elsewhere.The close registry imposed on the nanotubes, focuses attention on the cluster growth mechanism. The strict parallelism in the graphitic separation of the tube walls is maintained through changes of form and size, often leading to 180° turns, and accommodating neighboring clusters and defects. Iijima et. al. have proposed a growth scheme in terms of pentagonal and heptagonal defects and their combinations in a hexagonal graphitic matrix, the first bending the surface inward, and the second outward. We report here HREM observations that support Iijima’s suggestions, and add some new features that refine the interpretation of the growth mechanism. The structural elements of our observations are briefly summarized in the following four micrographs, taken in a Hitachi H-8100 TEM operating at an accelerating voltage of 200 kV and with a point-to-point resolution of 0.20 nm.


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