scholarly journals Effects of Al2O3 gate insulator on the instability of amorphous indium-gallium zinc oxide thin film transistors

AIP Advances ◽  
2018 ◽  
Vol 8 (8) ◽  
pp. 085112
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2016 ◽  
Vol 5 (5) ◽  
pp. N17-N21 ◽  
Author(s):  
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Yasuaki Ishikawa ◽  
Mami N. Fujii ◽  
Juan Paolo Bermundo ◽  
Eiji Takahashi ◽  
...  

2015 ◽  
Vol 135 (6) ◽  
pp. 192-198 ◽  
Author(s):  
Shinnosuke Iwamatsu ◽  
Yutaka Abe ◽  
Toru Yahagi ◽  
Seiya Kobayashi ◽  
Kazushige Takechi ◽  
...  

2021 ◽  
Vol 42 (3) ◽  
pp. 031101
Author(s):  
Ying Zhu ◽  
Yongli He ◽  
Shanshan Jiang ◽  
Li Zhu ◽  
Chunsheng Chen ◽  
...  

2011 ◽  
Vol 50 (3) ◽  
pp. 03CB06 ◽  
Author(s):  
Tong-Hun Hwang ◽  
Ik-Seok Yang ◽  
Oh-Kyong Kwon ◽  
Min-Ki Ryu ◽  
Choon-Won Byun ◽  
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2012 ◽  
Vol 520 (10) ◽  
pp. 3783-3786 ◽  
Author(s):  
Dong Youn Yoo ◽  
Eugene Chong ◽  
Do Hyung Kim ◽  
Byeong Kwon Ju ◽  
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2017 ◽  
Vol 3 (10) ◽  
pp. 1700221 ◽  
Author(s):  
Gerardo Gutierrez-Heredia ◽  
Ovidio Rodriguez-Lopez ◽  
Aldo Garcia-Sandoval ◽  
Walter E. Voit

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