scholarly journals Analytical analysis on the Dugdale model of a finite-width cracked plate by using crack line analysis method

AIP Advances ◽  
2020 ◽  
Vol 10 (11) ◽  
pp. 115208
Author(s):  
Zhijian Yi ◽  
Ya Li ◽  
Feng Huang ◽  
Min Wang ◽  
Kang Su ◽  
...  
2014 ◽  
Vol 496-500 ◽  
pp. 1052-1057 ◽  
Author(s):  
Jun Lin Deng ◽  
Ping Yang ◽  
Qin Dong ◽  
Xiang Yan

Thispaper adopts the crack line-field method to analyze finite-width stiffenedplates with central through I-type crack under uniaxial tensile loading. Themethod completely abandons the small scale yield hypothesis. The plastic stressand strain fields at crack tips and the plastic-zone length can be accurately determinedby combining with equivalent shear stress of Westergaard stress function in theposition of stiffener. It can be seen from the illustrative example that theresults of the paper agree well with those by finite element method.


1996 ◽  
Vol 82 (1) ◽  
pp. 53-57 ◽  
Author(s):  
Ryoji TSUJINO ◽  
Kenichiro MIYAMOTO ◽  
Tomohiro ITO ◽  
Toshitaka YUKI ◽  
Katsuhiko KATO ◽  
...  

Geophysics ◽  
1990 ◽  
Vol 55 (10) ◽  
pp. 1338-1346 ◽  
Author(s):  
D. C. Bartel ◽  
A. Becker

Interpretation of airborne electromagnetic (AEM) data is mainly concerned with determining the position, dip, and quality (or conductance) of an anomalous geologic feature. A new method of interpretation using spectral analysis has certain advantages over conventional methods. It is specifically applied to the interpretation of AEM anomalies observed with the INPUT1 time‐domain electromagnetic system that are related to thin rectangular conductive plates. Profiles of field data are converted to the wavenumber domain by applying a Fourier transform. Because the amplitude spectrum varies exponentially with the distance from the target to the receiver, the target depth is easily interpreted from the slope of a semilogarithmic plot of the spectrum. Analytical expressions for the amplitude spectrum of an AEM anomaly can only be obtained for a rudimentary model where the target is represented by a single filament of induced current. The spectra of more realistic models such as the dipping infinitely conductive half‐plane and the thin rectangular plate of finite conductance must be obtained numerically. The computed spectra are relatively insensitive to the target dip, except for the case of a horizontal target of finite width. For a flat‐lying target, the spectrum exhibits a distinctive modulation pattern from which the target width can be determined. A low wavenumbers the time‐decay characteristics of a given target are preserved so the its conductance can be determined. In most cases, however, this parameter as well as the target dip are just as easy to evaluate directly from the observed field data. The results obtained with the spectral analysis method of interpretation applied to field examples agree well with the known geology. Interpretation of field data requires correction for the velocity of the aircraft and the time constant of the receiver equipment. In the wavenumber domain, however, these effects are easily eliminated by a simple division. The spectral analysis method of electromagnetic interpretation is useful for determining the depth of the target because it is unaffected by dip, size, conductance, or profile position. One application of this method is in automated interpretation of portions of AEM data profiles, with large data sets over many conductors. Anomalies of interest can be picked out and interpreted automatically.


2020 ◽  
Vol 27 (6) ◽  
pp. 1477-1484
Author(s):  
Yiqing Cao ◽  
Zhijuan Shen ◽  
Haihe Xie

A third-order aberration analytical analysis method of soft X-ray optical systems with orthogonal and coplanar arrangement of the main planes of elements is proposed. Firstly, the transfer equations of the aperture ray and the principle ray are derived; then, based on the third-order aberration theory with the aperture-ray coordinates on the reference exit wavefront of a plane-symmetric optical system, the aberration expressions contributed by the wave aberration and defocus of this kind of optical system are studied in detail. Finally, the derived aberration calculation expressions are applied to calculate the aberration of two design examples of such types of optical systems; the images are compared with ray-tracing results obtained using the Shadow software to validate the aberration expressions. The study shows that the accuracy of the aberration expressions is satisfactory. The analytical analysis method of aberration is helpful in the design and optimization of the soft X-ray optical systems with orthogonal and coplanar arrangement of the main planes of optical elements.


1990 ◽  
Vol 34 ◽  
pp. 231-237
Author(s):  
M. Hirvonen

AbstractX-ray fluorescence has a long tradition as an on-line analysis method in many kinds of industrial processes. It is capable of determining elemental concentrations in material flows even under severe and varying process conditions with an accuracy which is often sufficient for on-line control purposes. Many times the elemental concentrations correlate highly enough with those of the minerals of interest to give useful mineral analysis. In general, a rather well-defined geometry in the XRF measurement is necessary for accurate results, which may impose strict requirements on the sampling system.


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