scholarly journals Conduction band offset-dependent induced threshold voltage shifts in a-InGaZnO TFTs under positive bias illumination stress

AIP Advances ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 035312
Author(s):  
Hyojung Kim ◽  
Soonkon Kim ◽  
Jongmin Yoo ◽  
Changyong Oh ◽  
Bosung Kim ◽  
...  
1997 ◽  
Vol 13 (11) ◽  
pp. 971-973 ◽  
Author(s):  
F. Ducroquet ◽  
G. Jacovetti ◽  
K. Rezzoug ◽  
S. Ababou ◽  
G. Guillot ◽  
...  

2017 ◽  
Vol 47 (2) ◽  
pp. 1201-1207 ◽  
Author(s):  
Yunfei Chen ◽  
Xuehai Tan ◽  
Shou Peng ◽  
Cao Xin ◽  
Alan E. Delahoy ◽  
...  

1997 ◽  
Vol 70 (12) ◽  
pp. 1590-1592 ◽  
Author(s):  
M. E. Rubin ◽  
H. R. Blank ◽  
M. A. Chin ◽  
H. Kroemer ◽  
V. Narayanamurti

2007 ◽  
Vol 90 (13) ◽  
pp. 131905 ◽  
Author(s):  
R. Kudrawiec ◽  
S. R. Bank ◽  
H. B. Yuen ◽  
H. Bae ◽  
M. A. Wistey ◽  
...  

2006 ◽  
Vol 957 ◽  
Author(s):  
Yahya Alivov ◽  
Xiao Bo ◽  
Fan Qian ◽  
Daniel Johnstone ◽  
Cole Litton ◽  
...  

ABSTRACTThe conduction band offset of n-ZnO/n-6H-SiC heterostructures fabricated by rf-sputtered ZnO on commercial n-type 6H-SiC substrates has been measured. Temperature dependent current-voltage characteristics, photocapacitance, and deep level transient spectroscopy measurements showed the conduction band offsets to be 1.25 eV, 1.1 eV, and 1.22 eV, respectively.


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