Prompt acceleration of a short-lifetime low-energy muon beam

Because of special characteristics (fully spin polarized and asymmetric decay to positron), muon acts as sensitive probe to study the local electronic and dynamics of materials. The muon of energy MeV or high, conventional muon, are used to study bulk properties of the materials. For the study of nanoscience, slow muon (20 eV - 30 keV) muon with low energy spread are essential that leads to development of slow muon microscopy. Introduction to muon microscopy, application of conventional muons and need of slow muon beam along with future prospects are briefly discussed. BIBECHANA 17 (2020) 139-145

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muCool: a novel low-energy muon beam for future precision experiments

Hyperfine Interactions ◽

10.1007/s10751-019-1589-4 ◽

2019 ◽

Vol 240 (1) ◽

Author(s):

Ivana Belosevic ◽

Aldo Antognini ◽

Yu Bao ◽

Andreas Eggenberger ◽

Malte Hildebrandt ◽

...

Keyword(s):

Muon Beam ◽

Low Energy

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Performance of X-rays crystal detectors with SiPM array readout exposed to the RIKEN-RAL low energy muon beam

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/j.nima.2018.10.030 ◽

2019 ◽

Vol 936 ◽

pp. 570-571

Author(s):

R. Benocci ◽

R. Bertoni ◽

M. Bonesini ◽

T. Cervi ◽

M. Clemenza ◽

...

Keyword(s):

Muon Beam ◽

Low Energy ◽

X Rays

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Prospects for ultra-low-energy muon beam at J-PARC

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/j.nima.2008.11.075 ◽

2009 ◽

Vol 600 (1) ◽

pp. 35-37 ◽

Cited By ~ 3

Author(s):

Pavel Bakule ◽

Yasuyuki Matsuda ◽

Yasuhiro Miyake ◽

Kanetada Nagamine ◽

Koichiro Shimomura ◽

...

Keyword(s):

Muon Beam ◽

Low Energy

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The new high-intensity surface muon beam for the generation of low-energy muons at PSI

Physica B Condensed Matter ◽

10.1016/j.physb.2005.11.132 ◽

2006 ◽

Vol 374-375 ◽

pp. 460-463 ◽

Cited By ~ 9

Author(s):

T. Prokscha ◽

E. Morenzoni ◽

K. Deiters ◽

F. Foroughi ◽

D. George ◽

...

Keyword(s):

High Intensity ◽

Muon Beam ◽

Low Energy ◽

Surface Muon

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Dissociated Σ=27 boundaries in silicon

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100105187 ◽

1988 ◽

Vol 46 ◽

pp. 624-625

Author(s):

A. Garg ◽

W.A.T. Clark ◽

J.P. Hirth

Keyword(s):

Electron Diffraction ◽

Local Minimum ◽

Boundary Energy ◽

Coincidence Site Lattice ◽

Boundary Plane ◽

Low Energy ◽

Theoretical Understanding ◽

Site Lattice ◽

Kikuchi Pattern ◽

Analysis Techniques

In the last twenty years, a significant amount of work has been done in the theoretical understanding of grain boundaries. The various proposed grain boundary models suggest the existence of coincidence site lattice (CSL) boundaries at specific misorientations where a periodic structure representing a local minimum of energy exists between the two crystals. In general, the boundary energy depends not only upon the density of CSL sites but also upon the boundary plane, so that different facets of the same boundary have different energy. Here we describe TEM observations of the dissociation of a Σ=27 boundary in silicon in order to reduce its surface energy and attain a low energy configuration.The boundary was identified as near CSL Σ=27 {255} having a misorientation of (38.7±0.2)°/[011] by standard Kikuchi pattern, electron diffraction and trace analysis techniques. Although the boundary appeared planar, in the TEM it was found to be dissociated in some regions into a Σ=3 {111} and a Σ=9 {122} boundary, as shown in Fig. 1.

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Transfer optics for high spatial resolution electron spectroscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100105394 ◽

1988 ◽

Vol 46 ◽

pp. 666-667

Author(s):

G. G. Hembree ◽

Luo Chuan Hong ◽

P.A. Bennett ◽

J.A. Venables

Keyword(s):

Magnetic Field ◽

Scanning Transmission Electron Microscope ◽

Low Energy ◽

Objective Lens ◽

State University ◽

Arizona State University ◽

Initial Field ◽

Resolution Electron ◽

Scanning Transmission ◽

Low Energy Electrons

A new field emission scanning transmission electron microscope has been constructed for the NSF HREM facility at Arizona State University. The microscope is to be used for studies of surfaces, and incorporates several surface-related features, including provision for analysis of secondary and Auger electrons; these electrons are collected through the objective lens from either side of the sample, using the parallelizing action of the magnetic field. This collimates all the low energy electrons, which spiral in the high magnetic field. Given an initial field Bi∼1T, and a final (parallelizing) field Bf∼0.01T, all electrons emerge into a cone of semi-angle θf≤6°. The main practical problem in the way of using this well collimated beam of low energy (0-2keV) electrons is that it is travelling along the path of the (100keV) probing electron beam. To collect and analyze them, they must be deflected off the beam path with minimal effect on the probe position.

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