Automatic defect inspection of thin film transistor-liquid crystal display panels using robust one-dimensional Fourier reconstruction with non-uniform illumination correction
2005 ◽
Vol 43
(21)
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pp. 4589-4607
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2004 ◽
Vol 42
(20)
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pp. 4331-4351
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2014 ◽
Vol 23
(1)
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pp. 013001
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1992 ◽
Vol 36
(1)
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pp. 3-10
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Keyword(s):
2021 ◽
Vol 9
(2)
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pp. 130
Keyword(s):
2020 ◽
Vol 258
◽
pp. 120587
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Keyword(s):
2011 ◽
Vol 38
(7)
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pp. 992-1007
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