Automatic defect inspection of thin film transistor-liquid crystal display panels using robust one-dimensional Fourier reconstruction with non-uniform illumination correction

2021 ◽  
Vol 92 (10) ◽  
pp. 103701
Author(s):  
Tengda Zhang ◽  
Jingtao Dong ◽  
Lei Yang ◽  
Shanlin Liu ◽  
Rongsheng Lu
2020 ◽  
Vol 258 ◽  
pp. 120587 ◽  
Author(s):  
Hau-Ming Chang ◽  
Shiao-Shing Chen ◽  
Zhi-Sheng Cai ◽  
Wen-Shing Chang ◽  
Saikat Sinha Ray ◽  
...  

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