Atomic resolution in situ observation on photon-induced reshaping and phase transitions of CsPbBr3 nanocube and quantum dot

2021 ◽  
Vol 119 (20) ◽  
pp. 203103
Author(s):  
Jiayi Li ◽  
Yifeng Ren ◽  
Yucong Su ◽  
Zhongnan Xi ◽  
Yurong Yang ◽  
...  
2020 ◽  
Vol 93 (1) ◽  
pp. 86-91
Author(s):  
Shoji Ishizaka ◽  
Fangqin Guo ◽  
Xiaomeng Tian ◽  
Samantha Seng ◽  
Yeny A. Tobon ◽  
...  

2012 ◽  
Vol 18 (S2) ◽  
pp. 1120-1121 ◽  
Author(s):  
M.B. Katz ◽  
Y. Duan ◽  
G.W. Graham ◽  
X. Pan ◽  
L.F. Allard

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.


1996 ◽  
Vol 74 (1) ◽  
pp. 25-36 ◽  
Author(s):  
Maureen L. Mulvmill ◽  
Kenji Uchino ◽  
Zhuang Li ◽  
Wenwu Cao

2014 ◽  
Vol 4 (1) ◽  
Author(s):  
C.-T. Pan ◽  
J. A. Hinks ◽  
Q. M. Ramasse ◽  
G. Greaves ◽  
U. Bangert ◽  
...  

2021 ◽  
Vol 51 (1) ◽  
Author(s):  
Hyunjong Lee ◽  
Odongo Francis Ngome Okello ◽  
Gi-Yeop Kim ◽  
Kyung Song ◽  
Si-Young Choi

AbstractGrowing demands for comprehending complicated nano-scale phenomena in atomic resolution has attracted in-situ transmission electron microscopy (TEM) techniques for understanding their dynamics. However, simple to safe TEM sample preparation for in-situ observation has been limited. Here, we suggested the optical microscopy based micro-manipulating system for transferring TEM samples. By adopting our manipulator system, several types of samples from nano-wires to plate-like thin samples were transferred on micro-electro mechanical systems (MEMS) chip in a single step. Furthermore, the control of electrostatic force between the sample and the probe tip is found to be a key role in transferring process.


2007 ◽  
Vol 90 (22) ◽  
pp. 221102 ◽  
Author(s):  
Carsten Kruse ◽  
Mariuca Gartner ◽  
Arne Gust ◽  
Detlef Hommel

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