Transmission electron microscopy study of small-angle grain boundaries, dislocations and modulated phases in Al-Li-Cu quasicrystals

1993 ◽  
Vol 67 (4) ◽  
pp. 991-1005 ◽  
Author(s):  
W. Staiger ◽  
D. P. Yu ◽  
M. Kléman
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Grain Boundaries ◽  
Small Angle ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Transmission Electron Microscopy Study ◽  
Modulated Phases ◽  
Transmission Electron

Transmission Electron Microscopy Study of YBa2Cu3O7-x Thin Film Multilayer Devices

1997 ◽  
Vol 474 ◽  
Author(s):  
M. A. Barnett ◽  
J. S. Abell ◽  
M. Aindow ◽  
N. G. Chew ◽  
P. J. Hirst ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Grain Boundaries ◽  
Slope Angle ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Base Layer ◽  
Transmission Electron Microscopy Study ◽  
Transmission Electron

ABSTRACTPatterned thin film multilayer structures, consisting of superconducting YBa2Cu3O7-x (YBCO) and insulating PrBa2Cu3O7-x (PrBCO), deposited onto (001) MgO substrates by electron beam co-evaporation, have been examined using Transmission Electron Microscopy (TEM). It is shown that PrBCO films grown over 30° steps in YBCO layers are free of tilt-grain boundaries. The PrBCO is c-oriented everywhere and shows pronounced faceting on the steps. Strain contrast features are present where the PrBCO has to adapt to large variations in the slope angle of the underlying YBCO layer. However, tilt-grain boundaries in YBCO or PrBCO layers are nucleated when depositing over small MgO steps formed by unintentional milling into the substrate. It is shown that grain boundaries associated with milled steps on MgO can be eliminated by the use of a PrBCO buffer layer beneath the superconducting base layer.

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