User Training at SSRL: Crystallography, X-ray Absorption Spectroscopy, Small-Angle X-ray Scattering, and X-ray Scattering Techniques

2016 ◽  
Vol 29 (6) ◽  
pp. 26-30
Author(s):  
Thomas Weiss ◽  
Apurva Mehta ◽  
Aina Cohen ◽  
Mike Soltis ◽  
Ritimukta Sarangi
2016 ◽  
Vol 44 (5) ◽  
pp. 537-546
Author(s):  
Guang Mo ◽  
Zhonghua Wu ◽  
Quan Cai ◽  
Zhihong Li ◽  
Xueqing Xing ◽  
...  

2020 ◽  
pp. 1353810
Author(s):  
Roberto Fumagalli ◽  
Abhishek Nag ◽  
Stefano Agrestini ◽  
Mirian Garcia-Fernandez ◽  
Andrew C. Walters ◽  
...  

2007 ◽  
Vol 40 (4) ◽  
pp. 791-795 ◽  
Author(s):  
Takeshi Morita ◽  
Yoshitada Tanaka ◽  
Kazuki Ito ◽  
Yoshihiro Takahashi ◽  
Keiko Nishikawa

A novel apparatus has been developed that enables the simultaneous determination of the absorption factor during measurement of small-angle X-ray scattering (SAXS) intensities of a sample. It was designed especially for the use of relatively low-energy X-rays at SAXS beamlines of synchrotron facilities. The X-ray intensity of transmittance is measured by a silicon PIN photodiode, which is implanted in a direct beamstop set in a vacuum chamber. Since the assembly transmits an attenuated direct beam to a detector during the scattering measurement, a zero-angle position can be monitored without additional operation. It was confirmed that the linearity between the signal from the photodiode and the intensity of X-rays is good and the photodiode is applicable for the desired purpose. For a performance test, the absorption factors of a supercritical fluid were measured with a wide density range.


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