Optimum path planning of elliptic and cubic nanoparticles using one and dual probe atomic force microscopes

2020 ◽  
pp. 1-19
Author(s):  
M. H. Korayem ◽  
H. Khaksar
Keyword(s):  
Path Planning ◽  
Atomic Force Microscopes ◽  
Atomic Force ◽  
Optimum Path ◽  
Dual Probe

Design and Control of a Dual-Probe Atomic Force Microscope

2018 ◽  
Vol 23 (1) ◽  
pp. 424-433 ◽  
Author(s):  
Muthukumaran Loganathan ◽  
Ayad Al-Ogaidi ◽  
Douglas A. Bristow
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force ◽  
And Control ◽  
Dual Probe

Geometry distortions of nanostructure edges scanned with amplitude-modulated atomic force microscopes

2013 ◽  
Vol 24 (11) ◽  
pp. 115008 ◽  
Author(s):  
Dorothee Hüser ◽  
Wolfgang Häßler-Grohne ◽  
Jonathan Hüser
Keyword(s):  
Atomic Force Microscopes ◽  
Atomic Force

Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams

2013 ◽  
Vol 84 (8) ◽  
pp. 083701 ◽  
Author(s):  
Eika Tsunemi ◽  
Kei Kobayashi ◽  
Noriaki Oyabu ◽  
Masaharu Hirose ◽  
Yoshiko Takenaka ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Beam ◽  
Laser Beams ◽  
Beam Deflection ◽  
Incident Laser ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dual Probe

Scratch direction and threshold force in nanoscale scratching using atomic force microscopes

2011 ◽  
Vol 257 (22) ◽  
pp. 9243-9250 ◽  
Author(s):  
Ampere A. Tseng ◽  
Chung-Feng Jeffrey Kuo ◽  
Shyankay Jou ◽  
Shinya Nishimura ◽  
Jun-ichi Shirakashi
Keyword(s):  
Atomic Force Microscopes ◽  
Threshold Force ◽  
Atomic Force

Investigation of position detectors for atomic force microscopes

2018 ◽  
Vol 29 (10) ◽  
pp. 105101 ◽  
Author(s):  
Nataliya Vorbringer-Dorozhovets ◽  
Rostyslav Mastylo ◽  
Eberhard Manske
Keyword(s):  
Atomic Force Microscopes ◽  
Atomic Force

scholarly journals Tip wear and tip breakage in high-speed atomic force microscopes

2019 ◽  
Vol 201 ◽  
pp. 28-37 ◽  
Author(s):  
Timo Strahlendorff ◽  
Gaoliang Dai ◽  
Detlef Bergmann ◽  
Rainer Tutsch
Keyword(s):  
High Speed ◽  
Atomic Force Microscopes ◽  
Atomic Force

A high-speed atomic force microscopy with super resolution based on path planning scanning

2020 ◽  
Vol 213 ◽  
pp. 112991
Author(s):  
Yinan Wu ◽  
Yongchun Fang ◽  
Chao Wang ◽  
Cunhuan Liu ◽  
Zhi Fan
Keyword(s):  
Atomic Force Microscopy ◽  
Path Planning ◽  
High Speed ◽  
Super Resolution ◽  
Force Microscopy ◽  
Atomic Force
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