Usability limits of the scalar effective frequency method used to determine modes distributions in oxide-confined vertical-cavity surface-emitting diode lasers

2005 ◽  
Vol 39 (1) ◽  
pp. 30-35 ◽  
Author(s):  
Tomasz Czyszanowski ◽  
Włodzimierz Nakwaski
Keyword(s):  
Diode Lasers ◽  
Cavity Surface ◽  
Effective Frequency ◽  
Frequency Method ◽  
Vertical Cavity Surface ◽  
Vertical Cavity

Low-threshold-current-density vertical-cavity surface-emitting AlGaAs/GaAs diode lasers

1989 ◽  
Vol 1 (8) ◽  
pp. 205-208 ◽  
Author(s):  
D. Botez ◽  
L.M. Zinkiewicz ◽  
T.J. Roth ◽  
L.J. Mawst ◽  
G. Peterson
Keyword(s):  
Current Density ◽  
Diode Lasers ◽  
Threshold Current ◽  
Threshold Current Density ◽  
Cavity Surface ◽  
Vertical Cavity Surface ◽  
Low Threshold ◽  
Vertical Cavity

Spreading resistance in proton‐implanted vertical‐cavity surface‐emitting diode lasers

1992 ◽  
Vol 61 (26) ◽  
pp. 3101-3103 ◽  
Author(s):  
Wl/odzimierz Nakwaski ◽  
Marek Osiński ◽  
Julian Cheng
Keyword(s):  
Diode Lasers ◽  
Cavity Surface ◽  
Spreading Resistance ◽  
Vertical Cavity Surface ◽  
Vertical Cavity

Physics of mode selectivity of vertical-cavity surface-emitting diode lasers

2010 ◽  
Vol 108 (4) ◽  
pp. 044501 ◽  
Author(s):  
Maciej Kuc ◽  
Robert P. Sarzała ◽  
Włodzimierz Nakwaski
Keyword(s):  
Diode Lasers ◽  
Cavity Surface ◽  
Mode Selectivity ◽  
Vertical Cavity Surface ◽  
Vertical Cavity
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