Combined wave based optical analysis and particle based thermal analysis of nanoscale ultrafast target heating of silicon utilizing a near-field scanning optical probe and a femtosecond laser

2009 ◽  
Vol 42 (7) ◽  
pp. 075502 ◽  
Author(s):  
Sy-Bor Wen ◽  
Ralph Greif
2010 ◽  
Vol 19 (04) ◽  
pp. 563-569
Author(s):  
H. ITO ◽  
K. FURUYA ◽  
Y. SHIBATA ◽  
Y. OOTUKA ◽  
S. NOMURA ◽  
...  

A real-space mapping of photovoltage near the edge of the Hall-bar of a GaAs/AlGaAs single heterojunction has been obtained using a dilution-refrigerator-based near-field scanning optical microscope in magnetic fields. The optical probe-sample surface distance dependence of photovoltage is investigated. We obtain photovoltage profile in the vicinity of the edge, which reflects the local chemical potential of the two-dimensional electron gas determined by the distribution of the compressible and incompressible strips.


2005 ◽  
Vol 80 (3) ◽  
pp. 461-465 ◽  
Author(s):  
Y. Lin ◽  
M.H. Hong ◽  
W.J. Wang ◽  
Y.Z. Law ◽  
T.C. Chong

Author(s):  
M. Isaacson

It has only been within the last half decade that the concept of super resolution microscopy in the near-field has been vigorously pursued and experimentally demonstrated. However, the idea of optical resolution unhindered by far field diffraction limitations was conceived more than a half century ago by Synge and further elaborated by O'Keefe in the fifties. That die method was possible, however, was only first demonstrated using 3cm wavelength microwaves almost 20 years later.The basic principles of the method of near field scanning optical microscopy (NSOM) have been described before in the literature. Briefly, the idea is as follows: if an optical probe (source or detector) of diameter D is positioned within a distance of approximately D/π from the surface of an object, and the reflected, transmitted or emitted light is detected, then the lateral spatial region from which the information occurs is limited to aregion of approximate size D and not by the wavelength of the illuminated or detected light.


1999 ◽  
Vol 584 ◽  
Author(s):  
N. Nagy ◽  
M. C. Goh

AbstractThe Near-field Scanning Optical Microscope (NSOM) is an innovative new form of surface microscopy, which can be used to obtain local spectroscopic information about surfaces, enabling the characterization of nanometer-sized regions. The most important component of this instrument is the scanning probe tip. In this paper, we discuss the production of a novel fiber optic probe that can be used in local spectroscopy with an NSOM, but also for simultaneous imaging of topography and chemical forces. The probe consists of a bent, tapered silicon dioxide optical fiber. We have determined the rates of selective wet chemical etching of germanium dioxide doped pure silica optical fibers and used this information to optimize the probe etching process. A systematic approach for the development and testing of such probes is presented. The performance of the optical probes was characterized using surfaces prepared by the technique of microcontact printing. Phase and friction images of these surfaces were obtained using both standard atomic force microscopy tips and the optical fiber probe. The new optical probe was capable of distinguishing between different chemical regions on the patterned surface.


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