Properties, magnetic susceptibility, critical currents and irreversibility fields of (Tl0.5Pb0.5)Sr2(Ca1−xGdx)Cu2Ozbulk superconductors

2008 ◽  
Vol 21 (8) ◽  
pp. 085002 ◽  
Author(s):  
W M Woch ◽  
R Zalecki ◽  
A Kołodziejczyk ◽  
H Sudra ◽  
G Gritzner
1999 ◽  
Vol 313 (1-2) ◽  
pp. 1-10 ◽  
Author(s):  
L. Trappeniers ◽  
J. Vanacken ◽  
L. Weckhuysen ◽  
K. Rosseel ◽  
A.Yu. Didyk ◽  
...  

2017 ◽  
Vol 39 (4) ◽  
pp. 441-455
Author(s):  
A. A. Kalenyuk ◽  
◽  
G. G. Kaminskyi ◽  
A. V. Semenov ◽  
V. O. Moskaliuk ◽  
...  

2016 ◽  
Vol 30 (3) ◽  
pp. 569-574 ◽  
Author(s):  
W. M. Woch ◽  
M. Kowalik ◽  
M. Giebułtowski ◽  
R. Zalecki ◽  
A. Szeliga ◽  
...  

1991 ◽  
Vol 62-64 ◽  
pp. 133-136
Author(s):  
A. Gladun ◽  
P. Verges ◽  
G. Fuchs ◽  
R. Mueller

Author(s):  
R. Sinclair ◽  
B.E. Jacobson

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).


Author(s):  
J. T. Sizemore ◽  
D. G. Schlom ◽  
Z. J. Chen ◽  
J. N. Eckstein ◽  
I. Bozovic ◽  
...  

Investigators observe large critical currents for superconducting thin films deposited epitaxially on single crystal substrates. The orientation of these films is often characterized by specifying the unit cell axis that is perpendicular to the substrate. This omits specifying the orientation of the other unit cell axes and grain boundary angles between grains of the thin film. Misorientation between grains of YBa2Cu3O7−δ decreases the critical current, even in those films that are c axis oriented. We presume that these results are similar for bismuth based superconductors and report the epitaxial orientations and textures observed in such films.Thin films of nominally Bi2Sr2CaCu2Ox were deposited on MgO using molecular beam epitaxy (MBE). These films were in situ grown (during growth oxygen was incorporated and the films were not oxygen post-annealed) and shuttering was used to encourage c axis growth. Other papers report the details of the synthesis procedure. The films were characterized using x-ray diffraction (XRD) and transmission electron microscopy (TEM).


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