SANS polarization analysis at V4 SANS instrument of HMI Berlin

2008 ◽  
Vol 19 (3) ◽  
pp. 034009 ◽  
Author(s):  
U Keiderling ◽  
A Wiedenmann ◽  
A Rupp ◽  
J Klenke ◽  
W Heil
Keyword(s):  
Polarization Analysis ◽  
Sans Instrument

Imaging magnetic microstructure with SEMPA

1993 ◽  
Vol 51 ◽  
pp. 1032-1033
Author(s):  
M. H. Kelley ◽  
J. Unguris ◽  
R. J. Celotta ◽  
D. T. Pierce
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Sandwich Structure ◽  
Magnetic Coupling ◽  
Polarization Analysis ◽  
Secondary Electrons ◽  
Magnetic Microstructure ◽  
Escape Depth ◽  
Scanning Electron

By measuring the spin polarization of secondary electrons generated in a scanning electron microscope, scanning electron microscopy with polarization analysis (SEMPA) can directly image the magnitude and direction of a material’s magnetization. Because the escape depth of the secondaries is only on the order of 1 nm, SEMPA is especially well-suited for investigating the magnetization of ultra-thin films and surfaces. We have exploited this feature of SEMPA to study the magnetic microstrcture and magnetic coupling in ferromagnetic multilayers where the layers may only be a few atomic layers thick. For example, we have measured the magnetic coupling in Fe/Cr/Fe(100) and Fe/Ag/Fe(100) trilayers and have found that the coupling oscillates between ferromagnetic and antiferromagnetic as a function of the Cr or Ag spacer thickness.The SEMPA apparatus has been described in detail elsewhere. The sample consisted of a magnetic sandwich structure with a wedge-shaped interlayer as shown in Fig. 1.

POLARIZATION ANALYSIS OF THE MAGNETIC DIFFUSE SCATTERING OF Na3Cr2P3O12

1988 ◽  
Vol 49 (C8) ◽  
pp. C8-199-C8-200
Author(s):  
N. Fanjat ◽  
O. Schaerpf ◽  
J. L. Soubeyroux ◽  
A. J. Dianoux ◽  
G. Lucazeau
Keyword(s):  
Diffuse Scattering ◽  
Polarization Analysis

Design of 40M SANS instrument at HANARO, Korea

2006 ◽  
Vol 385-386 ◽  
pp. 1177-1179 ◽  
Author(s):  
Young-Soo Han ◽  
Sung-Min Choi ◽  
Tae-Hwan Kim ◽  
Chang-Hee Lee ◽  
Hark-Rho Kim
Keyword(s):  
Sans Instrument

Time-dependent X-ray polarization analysis for anisotropic distribution of hot electrons in ultrahigh intensity laser plasmas

2007 ◽  
Vol 3 (1-2) ◽  
pp. 131-135 ◽  
Author(s):  
T. Kai ◽  
T. Kawamura ◽  
Y. Inubushi ◽  
H. Nishimura ◽  
T. Nakamura ◽  
...  
Keyword(s):  
Time Dependent ◽  
Hot Electrons ◽  
Polarization Analysis ◽  
X Ray ◽  
Laser Plasmas ◽  
Intensity Laser

High-resolution polarization analysis study of long-range magnetic order in cuprates

2005 ◽  
Vol 71 (21) ◽  
Author(s):  
Zahirul Islam ◽  
D. Haskel ◽  
J. C. Lang ◽  
G. Srajer ◽  
X. Liu ◽  
...  
Keyword(s):  
High Resolution ◽  
Long Range ◽  
Magnetic Order ◽  
Polarization Analysis ◽  
Analysis Study ◽  
Range Magnetic Order ◽  
Long Range Magnetic Order

scholarly journals Interference effects during the CO(1s−1π*) resonant excitation studied by polarization analysis of the CO+(A–X) fluorescence

2009 ◽  
Vol 194 (2) ◽  
pp. 022073
Author(s):  
Ph V Demekhin ◽  
I D Petrov ◽  
V L Sukhorukov ◽  
W Kielich ◽  
P Reiss ◽  
...  
Keyword(s):  
Resonant Excitation ◽  
Polarization Analysis ◽  
Interference Effects
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