scholarly journals Lateral scale calibration for focus variation microscopy

2018 ◽  
Vol 29 (6) ◽  
pp. 065012 ◽  
Author(s):  
Anas Alburayt ◽  
Wahyudin P Syam ◽  
Richard Leach
2001 ◽  
Vol 673 ◽  
Author(s):  
A. Maxwell Andrews ◽  
J.S. Speck ◽  
A.E. Romanov ◽  
M. Bobeth ◽  
W. Pompe

ABSTRACTAn approach is developed for understanding the cross-hatch morphology in lattice mismatched heteroepitaxial film growth. It is demonstrated that both strain relaxation associated with misfit dislocation formation and subsequent step elimination (e.g. by step-flow growth) are responsible for the appearance of nanoscopic surface height undulations (0.1-10 nm) on a mesoscopic (∼100 nm) lateral scale. The results of Monte Carlo simulations for dislocation- assisted strain relaxation and subsequent film growth predict the development of cross-hatch patterns with a characteristic surface undulation magnitude ∼50 Å in an approximately 70% strain relaxed In0.25Ga0.75As layers. The model is supported by atomic force microscopy (AFM) observations of cross-hatch morphology in the same composition samples grown well beyond the critical thickness for misfit dislocation generation.


1994 ◽  
Vol 76-77 ◽  
pp. 382-391 ◽  
Author(s):  
J.M. Hyde ◽  
A. Cerezo ◽  
R.P. Setna ◽  
P.J. Warren ◽  
G.D.W. Smith

2006 ◽  
Vol 113 ◽  
pp. 447-452 ◽  
Author(s):  
Saulius Kaušinis ◽  
Aurimas Jakštas ◽  
Rimantas Barauskas ◽  
Albinas Kasparaitis

2006 ◽  
Vol 2 (S240) ◽  
pp. 575-580 ◽  
Author(s):  
Brian D. Mason ◽  
William I. Hartkopf

AbstractThe U.S. Naval Observatory has produced its second CDROM of double star catalogs. This successor to the 2001.0 CDROM includes the latest versions (June 30 2006) of four major double star catalogs maintained at the USNO: •Washington Double Star Catalog (WDS),•Second Photometric Magnitude Difference Catalog,•Fourth Catalog of Interferometric Measurements of Binary Stars, and•Sixth Catalog of Orbits of Visual Binary Stars.Each of these catalogs had seen significant changes during the past six years; for example, the WDS has grown by over 150,000 measures and the number of systems in the Interferometric Catalog has nearly doubled. Other improvements include precise coordinates for the vast majority of systems, as well as new observing lists for tens of thousands of “neglected” doubles.Also included on this CDROM is a Catalog of Linear Elements for several hundred optical pairs. These elements should prove useful for improving the components' proper motions, as well as providing scale calibration out to several tens of arcseconds.As was done with its predecessor, the new CDROM is automatically distributed free of charge to members of the double star community and to astronomy libraries. Others may receive a complementary copy upon request.


Author(s):  
Dirk Van Dyck ◽  
Marc Op de Beeck

2019 ◽  
Vol 957 ◽  
pp. 187-194
Author(s):  
Roman Wdowik ◽  
Slawomir Swirad

The paper presents the method of a microscopic study of ceramic chips which can be useful in the analysis of physical phenomena regarding machining of ceramic materials. The analyzed chips were obtained on the milling machine tool from the Al2O3 based ceramic material. The measurements were performed using focus-variation technique (FVT). The InfiniteFocus Real3D microscope from Alicona Imaging company was applied. The paper mainly focuses on the methodology of measurements and the application of microscope’s software tools which can be used in the analysis of chips' 3D scans. The conditions of measurement process are discussed on the basis of the results of exemplary measurements of ceramic chips.


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